Application of the Josephson effect in electrical metrology
- Author
- JEANNERET, B1 ; BENZ, S. P2
[1] Federal Office of Metrology (METAS), Lindenweg 50, 3003 Bern-Wabern, Switzerland
[2] National Institute of Standards and Technology (NIST), Boulder, CO 80305, United States - Issue title
- Quantum Metrology and Fundamental Constants
- Author (monograph)
- PIQUEMAL, F (Editor); JECKELMANN, B (Editor)
- Source
The European physical journal. Special topics. 2009, Vol 172, pp 181-206, 26 p ; ref : 127 ref
- Publisher
- EDP Sciences, Les Ullis
- Publication country
- France
- Document type
- Article
- Language
- English
- Keyword (fr)
- Mesure tension électrique Métrologie quantique 0630
- Keyword (en)
- Voltage measurement Quantum metrology
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00F Metrology, measurements and laboratory procedures / 001B00F30 Measurements common to several branches of physics and astronomy
- Discipline
- Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21815934
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1140/epjst/e2009-01050-6 
https://dx.doi.org/10.1140/epjst/e2009-01050-6
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