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The Lowest Sampling Frequency not Existing in Theory

Author
YIZHONG SONG1 2 ; ZHIMIN ZHAO1
[1] College of automation engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China
[2] Department of Physics, Dezhou University, Dezhou, 253000, China
Conference title
Optoelectronic measurement technology and applications (2008 International Conference on Optical Instruments and Technology)
Conference name
International Conference on Optical Instruments and Technology (Beijing 2008)
Author (monograph)
Ye, Shenghua (Editor); Zhang, Guangjun (Editor); Ni, Jun (Editor)
Zhongguo yi qi yi biao xue hui, Optoelectronic-Mechanic Technology and System Integration Chapter, China (Organiser of meeting)
SPIE, United States (Organiser of meeting)
Zhongguo ke xue ji shu xie hui, China (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7160 ; 1Vol ; 71601G.1-71601G.9 ; ref : 19 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-7404-9
Scientific domain
Electronics; Metrology and instrumentation; Optics; Physics
Publisher
SPIE, Bellingham, Wash
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Analyse mathématique Echantillonnage Fréquence échantillonnage Méthode domaine temps Méthode mesure Optoélectronique Spectre fréquence Temps continu Transformation Fourier rapide 0130C 0707
Keyword (en)
Mathematical analysis Sampling Sampling frequency Time domain method Measuring methods Optoelectronics Frequency spectrum Continuous time Fast Fourier transforms
Keyword (es)
Muestreo Frecuencia muestreo Método dominio tiempo Optoelectrónica Espectro frecuencia Tiempo continuo
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings

Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G07 General equipment and techniques

Discipline
Metrology Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
21881920

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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