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Moire Fringe Measurement in the Data and Pixel Match of Holographic Disc Storage

Author
WANG YE1
[1] Department of Optics and Electrics, College of Science, Communication University of China, Beijing 100024, China
Conference title
Optoelectronic measurement technology and applications (2008 International Conference on Optical Instruments and Technology)
Conference name
International Conference on Optical Instruments and Technology (Beijing 2008)
Author (monograph)
Ye, Shenghua (Editor); Zhang, Guangjun (Editor); Ni, Jun (Editor)
Zhongguo yi qi yi biao xue hui, Optoelectronic-Mechanic Technology and System Integration Chapter, China (Organiser of meeting)
SPIE, United States (Organiser of meeting)
Zhongguo ke xue ji shu xie hui, China (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7160 ; 1Vol ; 716031.1-716031.5 ; ref : 8 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-7404-9
Scientific domain
Electronics; Metrology and instrumentation; Optics; Physics
Publisher
SPIE, Bellingham, Wash
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Dispositif CCD Disque optique Frange moiré Modulateur optique spatial Mémoire holographique Méthode mesure Optoélectronique Pixel Taux erreur bit 0130C 0707 4230M 4279H
Keyword (en)
Charge coupled devices Optical disk Moire fringes Spatial light modulators Holographic storage Measuring methods Optoelectronics Pixel Bit error rate
Keyword (es)
Disco óptico Optoelectrónica Pixel Tasa error bit
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings

Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G07 General equipment and techniques

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30M Speckle and moire patterns

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B79 Optical elements, devices, and systems / 001B40B79H Optical processors, correlators, and modulators

Discipline
Metrology Physics : optics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
21881974

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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