Influence of the Crystal Characterization of CsI Thin Film for X-ray Image Detectors
- Author
- LIU SHUANG1 ; CHEN XU1 ; ZHONG ZHIYONG2 ; FALCO, Charles M3
[1] School of optoelectronic information. University of electronic science and technology of china, 610054, Cheng du, China
[2] School of microelectronics and solid electronics, University of electronic science and technology of china, 610054, Cheng du, China
[3] College of optical sciences, University of arizona, Gould-Simpson building 1040 east 4th Tucson, Arizona 85721-0077, United States - Conference title
- Optoelectronic devices and integration (Photonics and Optoelectronics Meetings (POEM) 2008)
- Conference name
- Photonics and Optoelectronics Meetings (Wuhan 2008)
- Author (monograph)
- Zhang, Liming (Editor); O'Mahony, Mike J (Editor)
SPIE, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7279 ; 72790J.1-72790J.8 ; ref : 12 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-7538-1
- Scientific domain
- Electronics; Optics; Physics
- Publisher
- SPIE, Bellingham, Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Composé binaire Couche mince Diffraction RX Poudre Rayon X Silicium Oxyde Structure cristalline Structure surface 0130C O Si SiO2
- Keyword (en)
- Binary compounds Thin films XRD Powders X radiation Silicon Oxides Crystal structure Surface structure
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21921024
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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