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Multivariate analysis of ToF-SIMS data for biological applications

Author
PARK, Ji-Won1 2 ; MIN, Hyegeun1 2 ; KIM, Young-Pil3 ; HYUN KYONG SHON1 ; KIM, Jinmo4 ; DAE WON MOON1 2 ; TAE GEOL LEE1 2
[1] Nanobio Fusion Research Center, Korea Research Institute of Standards and Science, Daejeon 305-600, Korea, Republic of
[2] Department of Nano Surface Science, University of Science and Technology, Daejeon 305-600, Korea, Republic of
[3] Department of Biological Sciences, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Korea, Republic of
[4] Department of Physics, Brain Korea 21 Physics Research Division and Institute of Basic Science, Sungkyunkwan University, Suwon 440-746, Korea, Republic of
Issue title
Multivariate Analysis in Surface Analysis - Part II
Author (monograph)
GILMORE, Ian S (Author of introductory parts)1 ; WAGNER, Matthew S (Author of introductory parts)2
[1] National Physical Laboratory, Teddington, Middlesex TW11 0LW, United Kingdom
[2] The Procter and Gamble Company, Cincinnati, Ohio, 45252, United States
Source

Surface and interface analysis. 2009, Vol 41, Num 8, pp 694-703, 10 p ; ref : 45 ref

CODEN
SIANDQ
ISSN
0142-2421
Scientific domain
General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Wiley, Chichester
Publication country
United Kingdom
Document type
Article
Language
English
Author keyword
ToF-SIMS image analysis multivariate analysis principal component analysis
Keyword (fr)
Analyse composante principale Analyse image Analyse multivariable Analyse quantitative Autocorrélation Composition chimique Composé biologique Focalisation SIMS Tissu
Keyword (en)
Principal component analysis Image analysis Multivariate analysis Quantitative chemical analysis Autocorrelations Chemical composition Biological compound Focusing SIMS Tissues
Keyword (es)
Compuesto biológico
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B30 Atomic and molecular physics / 001B30A Electronic structure of atoms, molecules and their ions: theory / 001B30A15 Calculations and mathematical techniques in atomic and molecular physics (excluding electron correlation calculations)

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70I Electron and ion emission by liquids and solids; impact phenomena / 001B70I20 Impact phenomena (including electron spectra and sputtering) / 001B70I20R Atomic, molecular, and ion beam impact and interactions with surfaces

Pacs
3115 Calculations and mathematical techniques in atomic and molecular physics (excluding electron correlation calculations)

Discipline
Atomic and molecular physics Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
21934078

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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