Laser and electron beams physical analyses applied to the comparison between two silver tetradrachm greek coins
- Author
- TORRISI, L1 2 ; MONDIO, G3 ; MEZZASALMA, A. M3 ; MARGARONE, D1 2 ; CARIDI, F2 ; SERAFINO, T3 ; TORRISI, A4
[1] INFN-LNS Catania, Via S. Sofia 64, 95124 Catania, Italy
[2] Dipartimento di Fisica, Università di Messina, Ctr. Papardo 31, 98166 S. Agata-Messina, Italy
[3] Dip.to di Fisica della Materia e Ingegneria Elettronica, Università di Messina, Ctr. Papardo 31, 98166 S. Agata-ME, Italy
[4] Dipartimento di Fisica, Università di Catania, Via S. Sofia 64, 95124 Catania, Italy - Issue title
- Carbon-free SiOx films deposited from octamethylcyclotetrasiloxane
- Author (monograph)
- SCHÄFER, J1 ; FOEST, R1 ; QUADE, A1 ; OHL, A1 ; MEICHSNER, J2 ; WELTMANN, K. D1
[1] INP Greifswald, Felix-Hausdorff-Str. 2, 17489 Greifswald, Germany
[2] Ernst-Moritz-Arndt University Greifswald, Felix-Hausdorff-Str. 6, 17489 Greifswald, Germany - Source
The European physical journal. D, Atomic, molecular and optical physics (Print). 2009, Vol 54, Num 2, pp 225-232, 8 p ; ref : 10 ref
- ISSN
- 1434-6060
- Scientific domain
- Optics; Atomic molecular physics
- Publisher
- EDP Sciences, Les Ulis
- Publication country
- France
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse quantitative Analyse surface Argent Cuivre Diagnostic plasma Etude comparative Faisceau électron Fluorescence RX Fluorescence Microscopie électronique balayage Méthode ablation laser Méthode optique Physique plasma Profilométrie Quadripôle Spectrométrie RX Spectrométrie masse 5225 5270 5270K
- Keyword (en)
- Quantitative chemical analysis Surface analysis Silver Copper Plasma diagnostics Comparative study Electron beams X ray fluorescence Fluorescence Scanning electron microscopy Laser ablation technique Optical method Plasma physics Profilometry Quadrupoles X-ray spectroscopy Mass spectroscopy
- Keyword (es)
- Estudio comparativo Fluorescencia RX Método óptico Perfilometría
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B50 Physics of gases, plasmas and electric discharges / 001B50B Physics of plasmas and electric discharges / 001B50B25 Plasma properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B50 Physics of gases, plasmas and electric discharges / 001B50B Physics of plasmas and electric discharges / 001B50B70 Plasma diagnostic techniques and instrumentation / 001B50B70K Optical (ultraviolet, visible, infrared) measurements
- Discipline
- Physics of gases, plasmas and electric discharges
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21934385
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1140/epjd/e2008-00240-x 
https://dx.doi.org/10.1140/epjd/e2008-00240-x
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