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Optical investigations of germanium nanoclusters - Rich SiO2 layers produced by ion beam synthesis

Autor
KRZYZANOWSKA, H1 ; KULIK, M1 ; ZUK, J1 ; RZODKIEWICZ, W2 ; KOBZEV, A. P3 ; SKORUPA, W4
[1] Institute of Physics, Maria Curie-Skiodowska University, Pl. M. Curie-Skłodowskiej 1, 20-031 Lublin, Poland
[2] Institute of Electron Technology, Al. Lotników 32/46, 02-668 Warszawa, Poland
[3] Joint Institute for Nuclear Research, Frank Laboratory of Neutron Physics, 141980 Dubna, Moscow Region, Russian Federation
[4] Institute oflon Beam Physics and Materials Research, Forschungszentrum Rossendorf, P.O. Box 510119, 01314 Dresden, Germany
Titulo de la conferencia
Functional and Nanostructured Materials
Nombre de la conferencia
Workshop on Functional and Nanostructured Materials (5 ; L'viv 2008-08-31)
Autor ( monografía)
RYBICKI, Jarosław (Editor)1 ; WOJCIECHOWSKI, Krzystof (Editor)2
[1] Gdansk University of Technology, Faculty of Technical Physics and Applied Math., Narutowicza 11/12, 80-952 Gdansk, Poland
[2] Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznan, Poland
Fuente

Journal of non-crystalline solids. 2009, Vol 355, Num 24-27, pp 1347-1354, 8 p ; ref : 23 ref

CODEN
JNCSBJ
ISSN
0022-3093
Campo Científico
Crystallography; Chemical industry parachemical industry; Condensed state physics
Editor
Elsevier, Oxford
País de la publicación
United Kingdom
Tipo de documento
Conference Paper
Idioma
Russian
Palabra clave de autor
61.72.uf 68.55.Ln 78.67.-n 82.80.Yc Ge nanostructures Ion implantation Optical constants Rutherford backscattering Spectroscopic ellipsometry
Palabra clave (fr)
Agrégat solide Confinement quantique Couche mince Distribution concentration Ellipsométrie spectroscopique Germanium Implantation ion Indice extinction Indice réfraction Nanoamas Nanocomposite Oxyde de silicium Profil profondeur RBS Recuit Variation angulaire SiO2
Palabra clave (in)
Solid clusters Quantum confinement Thin films Concentration distribution Spectroscopic ellipsometry Germanium Ion implantation Extinction index Refractive index Nanocluster Nanocomposites Silicon oxides Depth profiles RBS Annealing Angular variation
Palabra clave (es)
Confinamiento cuántico Distribución concentración Elipsometría espectroscópica Nanomontón Variación angular
Clasificación
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films / 001B70H66S Composite materials

Disciplina
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Procedencia
Inist-CNRS
Base de datos
PASCAL
Identificador INIST
21946374

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