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Thermochromic effect in NdNiO3-δ thin films annealed in ambient air

Author
CAPON, F1 ; HORWAT, D1 ; PIERSON, J. F1 ; ZAGHRIOUI, M2 ; LAFFEZ, P2
[1] Institut Jean Lamour, Département CP2S, (UMR CNRS 7198), Ecole des Mines, Parc de Saurupt, CS 14234, 54042 Nancy, France
[2] Université de Tours, IUT de Blois, Laboratoire d'Electrodynamique des Matériaux Avancés, UMR CNRS CEA 6187, Place Jean Jaurès, 41029 Blois, France
Source

Journal of physics. D, Applied physics (Print). 2009, Vol 42, Num 18 ; 182006.1-182006.4 ; ref : 21 ref

CODEN
JPAPBE
ISSN
0022-3727
Scientific domain
Condensed state physics; Physics; Plasma physics
Publisher
Institute of Physics, Bristol
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Couche mince Effet thermooptique Non stoechiométrie Optimisation Oxyde de nickel Oxyde de néodyme Perovskites Pulvérisation réactive Recuit Spectre IR Spectre absorption Transition métal isolant NdNiO3 Si
Keyword (en)
Thin films Thermo-optical effects Nonstoichiometry Optimization Nickel oxide Neodymium oxides Perovskites Reactive sputtering Annealing Infrared spectra Absorption spectra Metal-insulator transition
Keyword (es)
Níquel óxido
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films / 001B70H66N Insulators

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
21946856

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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