The GSI Cryogenic Prototype Test Facility―First Experience Gained on 2-Phase-Flow Superconducting Prototype Magnets of the FAIR Project
- Author
- STAFINIAK, Andrzej1 ; FLOCH, Eric1 ; SCHROEDER, C1 ; MARZOUKI, Farid1 ; WALTER, Franz1
[1] Gesellschaft für Schwerionenforschung mbH (GSI), 64291 Darmstadt, Germany - Conference title
- THE 2008 APPLIED SUPERCONDUCTIVITY CONFERENCE : Chicago, IL, August 17-22, 2008. PART II OF THREE PARTS
- Conference name
- ASC2008 Applied Superconductivity Conference (Chicago, IL 2008-08-17)
- Source
IEEE transactions on applied superconductivity. 2009, Vol 19, Num 3, pp 1150-1153, 4 p ; 2 ; ref : 6 ref
- ISSN
- 1051-8223
- Scientific domain
- Electronics; Electrical engineering
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Loss measurement superconducting junction superconducting magnets superconducting test facilities
- Keyword (fr)
- Aimant Apprentissage Banc essai Cryogénie Cryostat Electroaimant supraconducteur Equipement collectif Essai qualification Gain Installation essai Jonction supraconductrice Perte courant alternatif Prototype Synchrotron Température cryogénique 2920L
- Keyword (en)
- Magnet Learning Test bench Cryogenics Cryostat Superconducting magnet Facility Prototype tests Gain Test facility Superconducting junction AC losses Prototype Synchrotrons Cryogenic temperature
- Keyword (es)
- Imán Aprendizaje Banco prueba Criogenia Criostato Electroimán supraconductor Equipamiento colectivo Prueba calificación Ganancia Instalación ensayo Unión supraconductora Prototipo Sincrotrón Temperatura criogénica
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B20 Nuclear physics / 001B20I Experimental methods and instrumentation for elementary-particle and nuclear physics / 001B20I20 Cyclic accelerators and storage rings / 001B20I20L Synchrotrons
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F11 Superconducting devices
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05B Testing. Reliability. Quality control
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05G Various equipment and components / 001D05G01 Electromagnets
- Discipline
- Electrical engineering. Electroenergetics Electronics Nuclear physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21985966
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TASC.2009.2017871 
https://dx.doi.org/10.1109/TASC.2009.2017871
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