The Use of Low Temperature Scanning Microscope for Estimating In-Plane Thermal Diffusivity in YBCO Thin Film
- Author
- MATSEKH, A1 ; KISS, T1 ; INOUE, M1 ; YOSHIZUMI, M2 ; SUTOH, Y2 ; IZUMI, T2 ; SHIOHARA, Y2
[1] Graduate School of Information Science and Electric Engineering, Department of Electrical and Electronic Systems Engineering, Kyushu University, Fukuoka 819-0395, Japan
[2] Super-conductivity Research Laboratory, ISTEC, Tokyo 135-0062, Japan - Conference title
- THE 2008 APPLIED SUPERCONDUCTIVITY CONFERENCE : Chicago, IL, August 17-22, 2008. PART III OF THREE PARTS
- Conference name
- ASC2008 Applied Superconductivity Conference (Chigaco, IL 2008-08-17)
- Source
IEEE transactions on applied superconductivity. 2009, Vol 19, Num 3, pp 2867-2871, 5 p ; 3 ; ref : 16 ref
- ISSN
- 1051-8223
- Scientific domain
- Electronics; Electrical engineering
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Grain boundary high-temperature superconductors low temperature laser scanning microscopy thermal diffusivity
- Keyword (fr)
- Bande supraconductrice Basse température Couche mince Couche supraconductrice Courant continu Courant critique Diffusion thermique Diffusivité thermique Dépendance fréquence Détecteur thermique Etude expérimentale Joint grain Liaison faible Microscope balayage Microscope laser Multicouche Racine carrée Retard phase Supraconducteur haute température 0707D
- Keyword (en)
- Superconducting tapes Low temperature Thin film Superconducting films Direct current Critical current Thermal diffusion Thermal diffusivity Frequency dependence Thermal detector Experimental study Grain boundary Weak links Scanning microscope Laser microscope Multiple layer Square root Phase delay High temperature superconductor
- Keyword (es)
- Baja temperatura Capa fina Corriente contínua Corriente crítica Difusión térmica Difusibilidad térmica Detector térmico Estudio experimental Limite grano Microscopio barrido Microscopio láser Capa múltiple Raíz cuadrada Retardo fase Supraconductor alta temperatura
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F11 Superconducting devices
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F13 Thermoelectric, pyroelectric devices, etc
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05C Materials
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05G Various equipment and components / 001D05G01 Electromagnets
- Discipline
- Electrical engineering. Electroenergetics Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21986362
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TASC.2009.2017712 
https://dx.doi.org/10.1109/TASC.2009.2017712
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