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The SORDS trimodal imager detector arrays

Author
WAKEFORD, Daniel1 ; ANDREWS, H. R1 ; WALLACE, Mark3 ; LANZA, Richard4 ; CLIFFORD, E. T. H1 ; LIQIAN LI1 ; BRAY, Nick1 ; LOCKLIN, Darren1 ; HYNES, Michael V2 ; TOOLIN, Maurice2 ; HARRIS, Bernard2 ; MCELROY, John2
[1] Bubble Technology Industries, Chalk River, Ontario, Canada
[2] Raytheon Integrated Defense Systems, Tewksbury, MA, United States
[3] Los Alamos National Laboratory, Los Alamos, NM, United States
[4] Massachusetts Institute of Technology, Cambridge, MA, United States
Conference title
Non-intrusive inspection technologies II (14 April 2009, Orlando, Florida, United States)
Conference name
Non-intrusive inspection technologies (02 ; Orlando FL 2009)
Author (monograph)
Blackburn, Brandon W (Editor)
SPIE, United States (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7310 ; 1Vol ; 73100D.1-73100D.9 ; ref : 2 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-7576-3 0-8194-7576-9
Scientific domain
Electronics; Metrology and instrumentation; Optics; Physics
Publisher
SPIE, Bellingham WA
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Algorithme Etalonnage Haute tension Imagerie Inspection Matrice détecteur Méthode mesure Méthode non invasive Réseau porte programmable Saisie donnée Synchronisation Technique diagnostic 0130C 0760 4279T
Keyword (en)
Algorithms Calibration High voltage Imagery Inspection Dectector arrays Measuring methods Non invasive method Field programmable gate arrays Data acquisition Synchronization Diagnostic techniques
Keyword (es)
Alta tensión Imaginería Método no invasivo
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings

Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B79 Optical elements, devices, and systems / 001B40B79T Optical computers, logic elements, interconnects, switches; neural networks

Discipline
Metrology Physics : optics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
22129317

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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