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Molecular Dynamics Study on Young's modulus of Silicon Nanostructures at finite temperature

Author
WANG, Yabin1 ; YU, Hong1 ; LU, Libing1 ; TAN, Yiyun1
[1] Key Laboratory of MEMS of Ministry of Education, Southeast University, Nanjing, Jiangsu, 210096, China
Conference title
International Symposium on Photoelectronic Detection and Imaging 2009 (Material and device technology for sensors : 17-19 June 2009, Beijing China)
Conference name
International Symposium on Photoelectronic Detection and Imaging (Beijing 2009)
Author (monograph)
Chen, Xu-yuan (Editor)
China Aerospace Science and Industry Corporation, Tianjin Jinhang Institute of Technical Physics, China (Organiser of meeting)
Zhongguo yu hang xue hui, Photoelectric Technology Professional Committee, China (Organiser of meeting)
SPIE, United States (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7381 ; 73812U.1-73812U.7 ; ref : 19 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-7662-3 0-8194-7662-5
Scientific domain
Electronics; Metrology and instrumentation; Optics; Physics
Publisher
SPIE, Bellingham, Wash
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Capteur Déformation mécanique Effet température Nanofil Nanostructure Reconstruction surface Silicium 0130C 0707D
Keyword (en)
Sensors Strains Temperature effects Nanowires Nanostructures Surface reconstruction Silicon
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings

Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G07 General equipment and techniques / 001B00G07D Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing

Discipline
Metrology Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
22173047

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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