The Focusing Optics x-ray Solar Imager: FOXSI
- Author
- KRUCKER, Säm1 ; CHRISTE, Steven1 ; RAMSEY, Brian3 ; TERADA, Yukikatsu4 ; ISHIKAWA, Shin-Nosuke5 6 ; KOKUBUN, Motohide5 ; SAITO, Shinya5 6 ; TAKAHASHI, Tadayuki5 6 ; WATANABE, Shin5 ; NAKAZAWA, Kazuhiro6 ; TAJIMA, Hiroyasu7 ; MASUDA, Satoshi8 ; GLESENER, Lindsay1 2 ; MINOSHIMA, Takashi8 ; SHOMOJO, Masumi9 ; MCBRIDE, Steve1 ; TURIN, Paul1 ; GLASER, David1 ; SAINT-HILAIRE, Pascal1 ; DELORY, Gregory1 ; LIN, R. P1 2 ; GUBAREV, Mikhail3
[1] Space Sciences Lab, U.C. Berkeley, 7 Gauss Way, Berkeley, CA 94720-7450, United States
[2] Physics Department, U.C. Berkeley, Berkeley, CA 94720, United States
[3] MSFC/NASA, Huntsville, AL 35812, United States
[4] Physics Department, Saitama University, Shimo-Okubo, Sakura-ku, Saitama 338-8570, Japan
[5] Institute of Space and Astronautical Science, Sagamihara, Kanagawa, 229-8510, Japan
[6] Department of Physics, University of Tokyo, Hongou, Bunkyo-ku, Tokyo, 113-0033, Japan
[7] KIPAC, Stanford University, Stanford, CA 94309, United States
[8] STEL, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8601, Japan
[9] NAOJ, Minamimaki, Minamisaku, Nagano 384-1305, Japan - Conference title
- Optics for EUV, X-Ray, and gamma-ray astronomy IV (4-6 August 2009, San Diego, California, United States)
- Conference name
- Optics for EUV, X-ray, and gamma-ray astronomy (04 ; San Diego CA 2009)
- Author (monograph)
- O'Dell, Stephen Lynn (Editor); Pareschi, Giovanni (Editor)
SPIE, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7437 ; 743705.1-743705.10 ; ref : 17 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 0-8194-7727-3 978-0-8194-7727-9
- Scientific domain
- Astronomy earth cosmic environment; Electronics; Optics; Physics
- Publisher
- SPIE, Bellingham, Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Imagerie Incidence rasante Optique RX Optique géométrique Rayon X Rayonnement UV extrême Rayonnement gamma Silicium Source RX Source rayonnement Spectrométrie RX 0130C 0785 0785F 4150
- Keyword (en)
- Imagery Grazing incidence X-ray optics Geometrical optics X radiation Extreme ultraviolet radiation Gamma radiation Silicon X-ray sources Radiation sources X-ray spectroscopy
- Keyword (es)
- Imaginería Incidencia rasante
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G85 X- and γ-ray instruments and techniques / 001B00G85F X- and γ-ray sources, mirrors, gratings and detectors
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40A Electromagnetism; electron and ion optics / 001B40A50 X-ray beams and x-ray optics
- Discipline
- Metrology Physics : electromagnetism Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 22321055
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1117/12.827950 
https://dx.doi.org/10.1117/12.827950
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