The Soft X-ray Imager (SXI) on board of the EXIST mission
- Author
- TAGLIAFERRI, G1 ; BASSO, S1 ; VILLA, G3 ; CONCONI, P1 ; PARESCHI, G1 ; BAZZANO, A2 ; CARAVEO, P3 ; GRINDLAY, J. E4 ; NATALUCCI, L2 ; UBERTINI, P2 ; USLENGHI, M3
[1] INAF-Osservatorio Astronomico di Brera, via Bianchi 46, 23807 Merate, Italy
[2] INAF-IASF, Via Fosso del Cavaliere 100, 00133 Roma, Italy
[3] IANF-IASF, Via Bassini 15, 20133 Milano, Italy
[4] Harvard-Smithsonian CfA, 60 Garden Street, Cambridge, MA 02138, United States - Conference title
- Optics for EUV, X-Ray, and gamma-ray astronomy IV (4-6 August 2009, San Diego, California, United States)
- Conference name
- Optics for EUV, X-ray, and gamma-ray astronomy (04 ; San Diego CA 2009)
- Author (monograph)
- O'Dell, Stephen Lynn (Editor); Pareschi, Giovanni (Editor)
SPIE, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7437 ; 743706.1-743706.10 ; ref : 10 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 0-8194-7727-3 978-0-8194-7727-9
- Scientific domain
- Astronomy earth cosmic environment; Electronics; Optics; Physics
- Publisher
- SPIE, Bellingham, Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Imagerie RX Miroir Nickel Optique RX Rayon X Rayonnement UV extrême Rayonnement gamma Technique conception optique Télescope 0130C 0785 4150 4215E 9555
- Keyword (en)
- X-ray imaging Mirrors Nickel X-ray optics X radiation Extreme ultraviolet radiation Gamma radiation Optical design techniques Telescopes
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G85 X- and γ-ray instruments and techniques
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B15 Geometrical optics / 001B40B15E Optical system design
- Pascal
- 001 Exact sciences and technology / 001E Earth, ocean, space / 001E03 Astronomy / 001E03A Fundamental astronomy and astrophysics. Instrumentation, techniques, and astronomical observations / 001E03A90 Historical astronomy and archaeoastronomy; and other topics in fundamental astronomy and astrophysics; instrumentation, techniques, and astronomical observations
- Discipline
- Astronomy Metrology Physics : optics Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 22321056
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1117/12.827372 
https://dx.doi.org/10.1117/12.827372
"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:17:\"10.1117\/12.827372\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:57:\"The Soft X-ray Imager (SXI) on board of the EXIST mission\";s:9:\"\u0000*\u0000jtitle\";s:70:\"Proceedings of SPIE, the International Society for Optical Engineering\";s:9:\"\u0000*\u0000stitle\";s:29:\"Proc. SPIE Int. Soc. Opt. Eng\";s:7:\"\u0000*\u0000date\";s:4:\"2009\";s:9:\"\u0000*\u0000volume\";s:4:\"7437\";s:8:\"\u0000*\u0000issue\";s:0:\"\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:18:\"743706.1-743706.10\";s:7:\"\u0000*\u0000issn\";s:9:\"0277-786X\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:11:\"TAGLIAFERRI\";s:10:\"\u0000*\u0000aufirst\";s:1:\"G\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:10:{i:0;s:8:\"BASSO, S\";i:1;s:8:\"VILLA, G\";i:2;s:10:\"CONCONI, P\";i:3;s:11:\"PARESCHI, G\";i:4;s:10:\"BAZZANO, A\";i:5;s:10:\"CARAVEO, P\";i:6;s:14:\"GRINDLAY, J. E\";i:7;s:12:\"NATALUCCI, L\";i:8;s:11:\"UBERTINI, P\";i:9;s:11:\"USLENGHI, M\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:31:\"0-8194-7727-3 978-0-8194-7727-9\";s:8:\"\u0000*\u0000coden\";s:6:\"PSISDG\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:105:\"Optics for EUV, X-Ray, and gamma-ray astronomy IV (4-6 August 2009, San Diego, California, United States)\";s:8:\"\u0000*\u0000title\";s:57:\"The Soft X-ray Imager (SXI) on board of the EXIST mission\";s:8:\"\u0000*\u0000place\";s:16:\"Bellingham, Wash\";s:6:\"\u0000*\u0000pub\";s:4:\"SPIE\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:17:\"10.1117\/12.827372\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:57:\"The Soft X-ray Imager (SXI) on board of the EXIST mission\";s:9:\"\u0000*\u0000jtitle\";s:70:\"Proceedings of SPIE, the International Society for Optical Engineering\";s:9:\"\u0000*\u0000stitle\";s:29:\"Proc. SPIE Int. Soc. Opt. Eng\";s:7:\"\u0000*\u0000date\";s:4:\"2009\";s:9:\"\u0000*\u0000volume\";s:4:\"7437\";s:8:\"\u0000*\u0000issue\";s:0:\"\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:18:\"743706.1-743706.10\";s:7:\"\u0000*\u0000issn\";s:9:\"0277-786X\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:11:\"TAGLIAFERRI\";s:10:\"\u0000*\u0000aufirst\";s:1:\"G\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:10:{i:0;s:8:\"BASSO, S\";i:1;s:8:\"VILLA, G\";i:2;s:10:\"CONCONI, P\";i:3;s:11:\"PARESCHI, G\";i:4;s:10:\"BAZZANO, A\";i:5;s:10:\"CARAVEO, P\";i:6;s:14:\"GRINDLAY, J. E\";i:7;s:12:\"NATALUCCI, L\";i:8;s:11:\"UBERTINI, P\";i:9;s:11:\"USLENGHI, M\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:31:\"0-8194-7727-3 978-0-8194-7727-9\";s:8:\"\u0000*\u0000coden\";s:6:\"PSISDG\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:105:\"Optics for EUV, X-Ray, and gamma-ray astronomy IV (4-6 August 2009, San Diego, California, United States)\";s:8:\"\u0000*\u0000title\";s:57:\"The Soft X-ray Imager (SXI) on board of the EXIST mission\";s:8:\"\u0000*\u0000place\";s:16:\"Bellingham, Wash\";s:6:\"\u0000*\u0000pub\";s:4:\"SPIE\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Istex access
"O:16:\"UnpaywallOpenUrl\":35:{s:8:\"\u0000*\u0000email\";s:27:\"assistance-portail@inist.fr\";s:6:\"\u0000*\u0000fmt\";N;s:6:\"\u0000*\u0000doi\";s:17:\"10.1117\/12.827372\";s:6:\"\u0000*\u0000pii\";N;s:7:\"\u0000*\u0000pmid\";N;s:9:\"\u0000*\u0000atitle\";N;s:9:\"\u0000*\u0000jtitle\";N;s:9:\"\u0000*\u0000stitle\";N;s:7:\"\u0000*\u0000date\";N;s:9:\"\u0000*\u0000volume\";N;s:8:\"\u0000*\u0000issue\";N;s:8:\"\u0000*\u0000spage\";N;s:8:\"\u0000*\u0000epage\";N;s:8:\"\u0000*\u0000pages\";N;s:7:\"\u0000*\u0000issn\";N;s:8:\"\u0000*\u0000eissn\";N;s:9:\"\u0000*\u0000aulast\";N;s:10:\"\u0000*\u0000aufirst\";N;s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";N;s:9:\"\u0000*\u0000aucorp\";N;s:7:\"\u0000*\u0000isbn\";N;s:8:\"\u0000*\u0000coden\";N;s:8:\"\u0000*\u0000genre\";N;s:7:\"\u0000*\u0000part\";N;s:9:\"\u0000*\u0000btitle\";N;s:8:\"\u0000*\u0000title\";N;s:8:\"\u0000*\u0000place\";N;s:6:\"\u0000*\u0000pub\";N;s:10:\"\u0000*\u0000edition\";N;s:9:\"\u0000*\u0000tpages\";N;s:9:\"\u0000*\u0000series\";N;s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";N;}"
Unpaywall access
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:17:\"10.1117\/12.827372\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:57:\"The Soft X-ray Imager (SXI) on board of the EXIST mission\";s:9:\"\u0000*\u0000jtitle\";s:70:\"Proceedings of SPIE, the International Society for Optical Engineering\";s:9:\"\u0000*\u0000stitle\";s:29:\"Proc. SPIE Int. Soc. Opt. Eng\";s:7:\"\u0000*\u0000date\";s:4:\"2009\";s:9:\"\u0000*\u0000volume\";s:4:\"7437\";s:8:\"\u0000*\u0000issue\";s:0:\"\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:18:\"743706.1-743706.10\";s:7:\"\u0000*\u0000issn\";s:9:\"0277-786X\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:11:\"TAGLIAFERRI\";s:10:\"\u0000*\u0000aufirst\";s:1:\"G\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:10:{i:0;s:8:\"BASSO, S\";i:1;s:8:\"VILLA, G\";i:2;s:10:\"CONCONI, P\";i:3;s:11:\"PARESCHI, G\";i:4;s:10:\"BAZZANO, A\";i:5;s:10:\"CARAVEO, P\";i:6;s:14:\"GRINDLAY, J. E\";i:7;s:12:\"NATALUCCI, L\";i:8;s:11:\"UBERTINI, P\";i:9;s:11:\"USLENGHI, M\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:31:\"0-8194-7727-3 978-0-8194-7727-9\";s:8:\"\u0000*\u0000coden\";s:6:\"PSISDG\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:105:\"Optics for EUV, X-Ray, and gamma-ray astronomy IV (4-6 August 2009, San Diego, California, United States)\";s:8:\"\u0000*\u0000title\";s:57:\"The Soft X-ray Imager (SXI) on board of the EXIST mission\";s:8:\"\u0000*\u0000place\";s:16:\"Bellingham, Wash\";s:6:\"\u0000*\u0000pub\";s:4:\"SPIE\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Europe PubMed Central access
"O:11:\"BaseOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:17:\"10.1117\/12.827372\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:57:\"The Soft X-ray Imager (SXI) on board of the EXIST mission\";s:9:\"\u0000*\u0000jtitle\";s:70:\"Proceedings of SPIE, the International Society for Optical Engineering\";s:9:\"\u0000*\u0000stitle\";s:29:\"Proc. SPIE Int. Soc. Opt. Eng\";s:7:\"\u0000*\u0000date\";s:4:\"2009\";s:9:\"\u0000*\u0000volume\";s:4:\"7437\";s:8:\"\u0000*\u0000issue\";s:0:\"\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:18:\"743706.1-743706.10\";s:7:\"\u0000*\u0000issn\";s:9:\"0277-786X\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:11:\"TAGLIAFERRI\";s:10:\"\u0000*\u0000aufirst\";s:1:\"G\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:10:{i:0;s:8:\"BASSO, S\";i:1;s:8:\"VILLA, G\";i:2;s:10:\"CONCONI, P\";i:3;s:11:\"PARESCHI, G\";i:4;s:10:\"BAZZANO, A\";i:5;s:10:\"CARAVEO, P\";i:6;s:14:\"GRINDLAY, J. E\";i:7;s:12:\"NATALUCCI, L\";i:8;s:11:\"UBERTINI, P\";i:9;s:11:\"USLENGHI, M\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:31:\"0-8194-7727-3 978-0-8194-7727-9\";s:8:\"\u0000*\u0000coden\";s:6:\"PSISDG\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:105:\"Optics for EUV, X-Ray, and gamma-ray astronomy IV (4-6 August 2009, San Diego, California, United States)\";s:8:\"\u0000*\u0000title\";s:57:\"The Soft X-ray Imager (SXI) on board of the EXIST mission\";s:8:\"\u0000*\u0000place\";s:16:\"Bellingham, Wash\";s:6:\"\u0000*\u0000pub\";s:4:\"SPIE\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Base Search access
"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:17:\"10.1117\/12.827372\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:57:\"The Soft X-ray Imager (SXI) on board of the EXIST mission\";s:9:\"\u0000*\u0000jtitle\";s:70:\"Proceedings of SPIE, the International Society for Optical Engineering\";s:9:\"\u0000*\u0000stitle\";s:29:\"Proc. SPIE Int. Soc. Opt. Eng\";s:7:\"\u0000*\u0000date\";s:4:\"2009\";s:9:\"\u0000*\u0000volume\";s:4:\"7437\";s:8:\"\u0000*\u0000issue\";s:0:\"\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:18:\"743706.1-743706.10\";s:7:\"\u0000*\u0000issn\";s:9:\"0277-786X\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:11:\"TAGLIAFERRI\";s:10:\"\u0000*\u0000aufirst\";s:1:\"G\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:10:{i:0;s:8:\"BASSO, S\";i:1;s:8:\"VILLA, G\";i:2;s:10:\"CONCONI, P\";i:3;s:11:\"PARESCHI, G\";i:4;s:10:\"BAZZANO, A\";i:5;s:10:\"CARAVEO, P\";i:6;s:14:\"GRINDLAY, J. E\";i:7;s:12:\"NATALUCCI, L\";i:8;s:11:\"UBERTINI, P\";i:9;s:11:\"USLENGHI, M\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:31:\"0-8194-7727-3 978-0-8194-7727-9\";s:8:\"\u0000*\u0000coden\";s:6:\"PSISDG\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:105:\"Optics for EUV, X-Ray, and gamma-ray astronomy IV (4-6 August 2009, San Diego, California, United States)\";s:8:\"\u0000*\u0000title\";s:57:\"The Soft X-ray Imager (SXI) on board of the EXIST mission\";s:8:\"\u0000*\u0000place\";s:16:\"Bellingham, Wash\";s:6:\"\u0000*\u0000pub\";s:4:\"SPIE\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
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