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Recent results from hard X-ray telescope characterization at SPring-8

Author
MIYAZAWA, Takuya1 ; OGASAKA, Yasushi1 ; ISHIDA, Yousuke1 ; YAMANE, Koudai1 ; FURUZAWA, Akihiro1 ; HABA, Yoshito1 ; KUNIEDA, Hideyo1 ; YAMASHITA, Koujun1 ; UESUGI, Kentaro2 ; SUZUKI, Yoshio2 ; TAMURA, Keisuke3 ; MAEDA, Yoshitomo3 ; IWAHARA, Tomonaga1 ; ISHIDA, Manabu3 ; OKAJIMA, Takashi4 ; KANOU, Yasufumi1 ; MAKINAE, Youta1 ; SASAYA, Shiori1 ; OHGI, Takuya1 ; MATSUDA, Kenji1 ; SAKAI, Michito1 ; NIKI, Daisuke1
[1] Department of Physics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8602, Japan
[2] Japan Synchrotron Radiation Research Institute, SPring-8, 1-1-1, Kouto, Sayo-cho, Sayo-gun, Hyoto 679-5198, Japan
[3] Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency, 3-1-1, Yoshinodai, Sagamihara, Kanagawa 229-8510, Japan
[4] NASA's Goddard Space Flight Center, Code 662, Astrophysics Science Division, Greenbelt, MD 20771, United States
Conference title
Optics for EUV, X-Ray, and gamma-ray astronomy IV (4-6 August 2009, San Diego, California, United States)
Conference name
Optics for EUV, X-ray, and gamma-ray astronomy (04 ; San Diego CA 2009)
Author (monograph)
O'Dell, Stephen Lynn (Editor); Pareschi, Giovanni (Editor)
SPIE, United States (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7437 ; 74371P.1-74371P.8 ; ref : 13 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
0-8194-7727-3 978-0-8194-7727-9
Scientific domain
Astronomy earth cosmic environment; Electronics; Optics; Physics
Publisher
SPIE, Bellingham, Wash
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Distance focale Etalonnage Facteur réflexion Fonction étalement point Imagerie RX Miroir multicouche Multicouche Méthode mesure Optique RX Qualité image Rayon X Rayonnement UV extrême Rayonnement gamma Rayonnement synchrotron Réflecteur Résolution angulaire Télescope 0130C 0785 4150 4279F 9555
Keyword (en)
Focal length Calibration Reflectivity Point spread functions X-ray imaging Multilayer mirror Multilayers Measuring methods X-ray optics Image quality X radiation Extreme ultraviolet radiation Gamma radiation Synchrotron radiation Reflectors Angular resolution Telescopes
Keyword (es)
Distancia focal Calidad imagen
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings

Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G85 X- and γ-ray instruments and techniques

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B79 Optical elements, devices, and systems / 001B40B79F Reflectors, beam splitters, and deflectors

Pascal
001 Exact sciences and technology / 001E Earth, ocean, space / 001E03 Astronomy / 001E03A Fundamental astronomy and astrophysics. Instrumentation, techniques, and astronomical observations / 001E03A90 Historical astronomy and archaeoastronomy; and other topics in fundamental astronomy and astrophysics; instrumentation, techniques, and astronomical observations

Discipline
Astronomy Metrology Physics : optics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
22321109

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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