Ti02/Au/Ti02 multilayer thin films: Novel metal-based transparent conductors for electrochromic devices
- Author
- LANSAKER, P. C1 ; BACKHOLM, J1 ; NIKLASSON, G. A1 ; GRANQVIST, C. G1
[1] Department of Engineering Sciences, The Ångström Laboratory, Uppsala University, P.O. Box 534, 751 21 Uppsala, Sweden - Conference title
- Transparent Conductive Oxides: TCO2008
- Conference name
- International Symposium on Transparent Conductive Oxides (TCO2008) (TCO2008) (2 ; Hersonissos, Crète 2008-10-22)
- Author (monograph)
- FORTUNATO, Elvira (Editor)1 ; LEE, Sang Yeol (Editor)2 ; VAYSSIERES, Lionel (Editor)
[1] Materials Science Department/CENIMAT, Faculty of Sciences and Technology, New university of Lisbon, Campus da Caparica, 2829-516 Caparica, Portugal
[2] Center for Energy Materials Research, Korea Institute of Science and Technology, Seoul 136-791, Korea, Republic of - Source
Thin solid films. 2010, Vol 518, Num 4, pp 1225-1229, 5 p ; ref : 28 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Au film Drude theory Electrochemical durability Electrochromics Electron microscopy Optical modelling Spectrophotometry Sputter deposition
- Keyword (fr)
- Couche mince métallique Couche mince Dispositif électrochromique Dépôt physique phase vapeur Dépôt pulvérisation Electrochromisme Epaisseur couche Facteur réflexion Facteur transmission Matériau transparent Microscopie électronique Modèle Drude Modèle optique Multicouche Or Oxyde de titane Pulvérisation cathodique Résistivité électrique Spectre réflexion Structure îlot Verre 6855J 7820J 8115C 8560P TiO2
- Keyword (en)
- Metallic thin films Thin film Electrochromic device Physical vapor deposition Sputter deposition Electrochromism Layer thickness Reflectance Transmittance Transparent material Electron microscopy Drude model Optical models Multiple layer Gold Titanium oxide Cathodic sputtering Electric resistivity Reflection spectrum Island structure Glass
- Keyword (es)
- Capa fina Dispositivo electrocrómico Deposición física fase vapor Electrocromismo Espesor capa Coeficiente reflexión Factor transmisión Material transparente Microscopía electrónica Capa múltiple Oro Titanio óxido Pulverización catódica Resistividad eléctrica Espectro reflexión Estructura islote Vidrio
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H20 Optical properties of bulk materials and thin films / 001B70H20J Electrooptical effects
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15C Deposition by sputtering
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03H Display
- Discipline
- Electronics Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 22504383
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2009.02.158 
https://dx.doi.org/10.1016/j.tsf.2009.02.158
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