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Influence of the epitaxial growth and device processing on the overlay accuracy during processing of the d-DotFET

Author
MOERS, J1 ; GERHARZ, J1 ; RINKE, G1 ; MUSSLER, G1 ; TRELLENKAMP, St1 ; GRÜTZMACHER, D1
[1] Institute of Bio- and Nanosystems IBN-1, Forschungszentrum Jülich, D-52425 Jülich, and Jülich Aachen Research Alliance (JARA), Germany
Conference title
Silicon and Germanium Issues for Future CMOS Devices
Conference name
2009 E-MRS 2009 Spring Meeting Symposium I (Strasbourg 2009-06-08)
Author (monograph)
PELAZ, Lourdes (Editor); MIRABELLA, Salvo (Editor)1 ; LARSEN, Arne Nylandsted (Editor)
European Material Research Society (E-MRS), Strasbourg, France (Organiser of meeting)
[1] MATIS CNR-INFM and Dipartimento di Fisica e Astronomia, Università di Catania, Via S. Sofia 64, 95123 Catania, Italy
Source

Thin solid films. 2010, Vol 518, Num 9, pp 2565-2568, 4 p ; ref : 7 ref

CODEN
THSFAP
ISSN
0040-6090
Scientific domain
Crystallography; Metallurgy, welding; Condensed state physics
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Author keyword
E-beam-lithography MOSFET Overlay Strained silicon
Keyword (fr)
Autoassemblage Couche contrainte Couche épitaxique Diélectrique permittivité élevée Electrode commande Epitaxie Germanium Lithographie Loi échelle Mobilité porteur charge Mécanisme croissance Porte logique Réaction dirigée Silicium Transistor MOSFET 6855A 8530T Si
Keyword (en)
Self-assembly Strained layer Epitaxial layers High k dielectric Gates Epitaxy Germanium Lithography Scaling laws Carrier mobility Growth mechanism Logic gates Template reaction Silicon MOSFET
Keyword (es)
Capa forzada Dieléctrico alta constante dieléctrica Mecanismo crecimiento Reacción dirigida
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15A Theory and models of film growth

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors

Discipline
Electronics Physics and materials science
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
22520821

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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