Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films
- Author
- FEJFAR, A1 ; VETUSHKA, A1 ; KALUSOVA, V1 ; CERTIK, O1 ; LEDINSKY, M1 ; REZEK, B1 ; STUCHLIK, J1 ; KOCKA, J1
[1] Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnická 10, 162 53 Prague, Czech Republic - Conference name
- Conference on Amorphous and Nanocrystalline Semiconductors (ICAN 23) (ICAN 23) (23 ; Utrecht 2009-08-23)
- Source
Physica status solidi. A, Applications and materials science (Print). 2010, Vol 207, Num 3, pp 582-586, 5 p ; ref : 34 ref
- ISSN
- 1862-6300
- Scientific domain
- Crystallography; Electronics; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
- Publisher
- Wiley-VCH, Berlin
- Publication country
- Germany
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Champ interne Champ local Conductivité obscurité Couche mince Distribution champ Echelle nanométrique Microscopie force atomique Microstructure Modèle milieu effectif Percolation Phase amorphe Phase cristalline Relation structure propriété Silicium Structure locale Si
- Keyword (en)
- Internal field Local field Dark conductivity Thin films Field distribution Nanometer scale Atomic force microscopy Microstructure Effective medium model Percolation Amorphous phase Crystalline phase Property structure relationship Silicon Local structure
- Keyword (es)
- Campo interno Campo local Distribución campo Modelo medio efectivo Fase amorfa Fase cristalina Relación estructura propiedad Estructura local
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C50 Electronic transport phenomena in thin films and low-dimensional structures / 001B70C50D Low-field transport and mobility; piezoresistance
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 22551516
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/pssa.200982907 
https://dx.doi.org/10.1002/pssa.200982907
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