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Monolithic gallium arsenide cantilever for scanning near-field microscopy

Author
HEISIG, S1 ; DANZEBRINK, H.-U2 ; LEYK, A3 ; MERTIN, W3 ; MÜNSTER, S1 ; OESTERSCHULZE, E1
[1] University of Kassel, Institute of Technical Physics, Heinrich-Plett-Str. 40, 34109 Kassel, Germany
[2] Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany
[3] Gerhard-Mercator-Universität-GH Duisburg, Fachgebiet Werkstoffe der Elektrotechnik, Bismarckstrasse 81 BA, 47048 Duisburg, Germany
Conference title
NFO-4 : International Conference on Near-field Optics and Related Techniques
Conference name
NFO-4 : International Conference on Near-field Optics and Related Techniques (4 ; Jerusalem 1997-02-09)
Author (monograph)
VAN HULST, Niek (Editor)1 ; LEWIS, Aaron (Editor)2
[1] University of Twente, Enschede, Netherlands
[2] Hebrew University of Jerusalem, Israel
Source

Ultramicroscopy. 1998, Vol 71, Num 1-4, pp 99-105 ; ref : 9 ref

CODEN
ULTRD6
ISSN
0304-3991
Scientific domain
Cell biology, histology; Crystallography; Physics
Publisher
Elsevier Science, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Keyword (fr)
Capteur Etude expérimentale Hyperfréquence Microscopie champ proche Microscopie force atomique Microscopie optique champ proche Microstructure Semiconducteur III-V
Keyword (en)
Sensors Experimental study Microwave radiation Scanning probe microscopy Atomic force microscopy Scanning near field optical microscopy Microstructure III-V semiconductors
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G79 Scanning probe microscopes, components and techniques / 001B00G79C Scanning tunneling microscopes

Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G79 Scanning probe microscopes, components and techniques / 001B00G79L Atomic force microscopes

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02B Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits

Pacs
0779C Scanning tunneling microscopes

Pacs
0779L Atomic force microscopes

Pacs
8440 Radiowave and microwave (including millimeter wave) technology

Discipline
Electronics Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
2266307

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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