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Microstructure-sensitive computational modeling of fatigue crack formation

Author
MCDOWELL, D. L1 ; DUNNE, F. P. E2
[1] GWW School of Mechanical Engineering, School of Materials Science & Engineering Georgia Institute of Technology, Atlanta, GA, United States
[2] Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United Kingdom
Issue title
Emerging Frontiers in Fatigue
Author (monograph)
MCDOWELL, David L (Editor)1
[1] Georgia Institute of Technology, Atlanta, GA, United States
Source

International journal of fatigue. 2010, Vol 32, Num 9, pp 1521-1542, 22 p ; ref : 206 ref

CODEN
IJFADB
ISSN
0142-1123
Scientific domain
Mechanical engineering; Metallurgy, welding; Polymers, paint and wood industries
Publisher
Elsevier, Kidlington
Publication country
United Kingdom
Document type
Article
Language
English
Author keyword
Crystal plasticity Fatigue crack formation Fatigue crack initiation High cycle fatigue Microstructure Simulation
Keyword (fr)
Amorçage fissure Fatigue Fissure fatigue Microstructure Modélisation Plasticité Propriété mécanique Simulation
Keyword (en)
Crack initiation Fatigue Fatigue crack Microstructure Modeling Plasticity Mechanical properties Simulation
Keyword (es)
Iniciación grieta Fatiga Fisura fatiga Microestructura Modelización Plasticidad Propiedad mecánica Simulación
Keyword (de)
Risseinleitung Ermuedung Ermuedungsriss Mikrogefuege Plastizitaet Simulation
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy / 001D11G Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology / 001D11G03 Fatigue

Discipline
Metals. Metallurgy
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
22846902

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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