The Effects of a Stabilizer Thickness of the YBCO Coated Conductor (CC) on the Quench/Recovery Characteristics
- Author
- KWON, N. Y1 ; KIM, H. S1 ; KIM, K. L1 ; HAHN, S2 ; KIM, H.-R3 ; HYUN, O.-B3 ; KIM, H. M4 ; KIM, W. S5 ; PARK, C5 ; LEE, H. G1
[1] Department of Materials Science and Engineering, Korea University, Seoul 135-713, Korea, Republic of
[2] Francis Bitter Magnet Laboratory (FBML), MIT, Cambridge, MA 02139, United States
[3] Transmission and Distribution Laboratory, Korea Electric Power Research Institute, Daejeon 103-16, Korea, Republic of
[4] Korea Electrotechnology Research Institute, Changwon 641-120, Korea, Republic of
[5] Department of Materials Science and Engineering, Seoul National University, Seoul 136-713, Korea, Republic of - Conference title
- THE TWENTY-FIRST INTERNATIONAL CONFERENCE ON MAGNET TECHNOLOGY, Hefei, Anhui, China, October 18-23, 2009
- Conference name
- International Conference on Magnet Technology (MT) (MT) (21 ; Hefei, Anhui 2009-10-18)
- Author (monograph)
- Institute of Electrical and Electronic Engineers (IEEE), New York, NY, United States (Organiser of meeting)
- Source
IEEE transactions on applied superconductivity. 2010, Vol 20, Num 3, pp 1246-1249, 4 p ; ref : 8 ref
- ISSN
- 1051-8223
- Scientific domain
- Electronics; Electrical engineering
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Electric field intensities (E) YBCO coated conductor (CC) quench/recovery characteristics stabilizer superconducting fault current limiter (SFCL)
- Keyword (fr)
- Caractéristique électrique Champ électrique Comportement thermique Conducteur électrique Courant défaut Dispositif protection Dispositif supraconducteur Epaisseur Etude comparative Etude expérimentale Haute performance Limiteur courant défaut Matériau revêtu Procédé de transfert Prévention dommage Restauration (propriété) Réseau électrique Source chaleur Supraconducteur haute température Trempe
- Keyword (en)
- Electrical characteristic Electric field Thermal behavior Electrical conductor Fault currents Protective device Superconductor device Thickness Comparative study Experimental study High performance Fault current limiters Coated material Transfer processing Damage prevention Recovery (properties) Electrical network Heat source High temperature superconductor Quenching
- Keyword (es)
- Característica eléctrica Campo eléctrico Comportamiento térmico Conductor eléctrico Dispositivo protección Dispositivo supraconductor Espesor Estudio comparativo Estudio experimental Alto rendimiento Material revestido Procesamiento de transferencia Prevención daño Restauración (propiedad) Red eléctrica Fuente calor Supraconductor alta temperatura Temple
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F11 Superconducting devices
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05G Various equipment and components / 001D05G01 Electromagnets
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05G Various equipment and components / 001D05G04 Electric connection. Cables. Wiring
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05I Electrical power engineering / 001D05I01 Power networks and lines / 001D05I01I Miscellaneous
- Discipline
- Electrical engineering. Electroenergetics Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 22862753
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Access to the document
Install on your browser
DOI
10.1109/TASC.2009.2039864 
https://dx.doi.org/10.1109/TASC.2009.2039864
"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1109\/TASC.2009.2039864\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:110:\"The Effects of a Stabilizer Thickness of the YBCO Coated Conductor (CC) on the Quench\/Recovery Characteristics\";s:9:\"\u0000*\u0000jtitle\";s:46:\"IEEE transactions on applied superconductivity\";s:9:\"\u0000*\u0000stitle\";s:27:\"IEEE trans. appl. supercond\";s:7:\"\u0000*\u0000date\";s:4:\"2010\";s:9:\"\u0000*\u0000volume\";s:2:\"20\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:4:\"1246\";s:8:\"\u0000*\u0000epage\";s:4:\"1249\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1051-8223\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:4:\"KWON\";s:10:\"\u0000*\u0000aufirst\";s:4:\"N. Y\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:9:{i:0;s:9:\"KIM, H. S\";i:1;s:9:\"KIM, K. L\";i:2;s:7:\"HAHN, S\";i:3;s:9:\"KIM, H.-R\";i:4;s:10:\"HYUN, O.-B\";i:5;s:9:\"KIM, H. M\";i:6;s:9:\"KIM, W. S\";i:7;s:7:\"PARK, C\";i:8;s:9:\"LEE, H. G\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:104:\"THE TWENTY-FIRST INTERNATIONAL CONFERENCE ON MAGNET TECHNOLOGY, Hefei, Anhui, China, October 18-23, 2009\";s:8:\"\u0000*\u0000title\";s:110:\"The Effects of a Stabilizer Thickness of the YBCO Coated Conductor (CC) on the Quench\/Recovery Characteristics\";s:8:\"\u0000*\u0000place\";s:12:\"New York, NY\";s:6:\"\u0000*\u0000pub\";s:49:\"Institute of Electrical and Electronics Engineers\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"4\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1109\/TASC.2009.2039864\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:110:\"The Effects of a Stabilizer Thickness of the YBCO Coated Conductor (CC) on the Quench\/Recovery Characteristics\";s:9:\"\u0000*\u0000jtitle\";s:46:\"IEEE transactions on applied superconductivity\";s:9:\"\u0000*\u0000stitle\";s:27:\"IEEE trans. appl. supercond\";s:7:\"\u0000*\u0000date\";s:4:\"2010\";s:9:\"\u0000*\u0000volume\";s:2:\"20\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:4:\"1246\";s:8:\"\u0000*\u0000epage\";s:4:\"1249\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1051-8223\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:4:\"KWON\";s:10:\"\u0000*\u0000aufirst\";s:4:\"N. Y\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:9:{i:0;s:9:\"KIM, H. S\";i:1;s:9:\"KIM, K. L\";i:2;s:7:\"HAHN, S\";i:3;s:9:\"KIM, H.-R\";i:4;s:10:\"HYUN, O.-B\";i:5;s:9:\"KIM, H. M\";i:6;s:9:\"KIM, W. S\";i:7;s:7:\"PARK, C\";i:8;s:9:\"LEE, H. G\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:104:\"THE TWENTY-FIRST INTERNATIONAL CONFERENCE ON MAGNET TECHNOLOGY, Hefei, Anhui, China, October 18-23, 2009\";s:8:\"\u0000*\u0000title\";s:110:\"The Effects of a Stabilizer Thickness of the YBCO Coated Conductor (CC) on the Quench\/Recovery Characteristics\";s:8:\"\u0000*\u0000place\";s:12:\"New York, NY\";s:6:\"\u0000*\u0000pub\";s:49:\"Institute of Electrical and Electronics Engineers\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"4\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Istex access
"O:16:\"UnpaywallOpenUrl\":35:{s:8:\"\u0000*\u0000email\";s:27:\"assistance-portail@inist.fr\";s:6:\"\u0000*\u0000fmt\";N;s:6:\"\u0000*\u0000doi\";s:25:\"10.1109\/TASC.2009.2039864\";s:6:\"\u0000*\u0000pii\";N;s:7:\"\u0000*\u0000pmid\";N;s:9:\"\u0000*\u0000atitle\";N;s:9:\"\u0000*\u0000jtitle\";N;s:9:\"\u0000*\u0000stitle\";N;s:7:\"\u0000*\u0000date\";N;s:9:\"\u0000*\u0000volume\";N;s:8:\"\u0000*\u0000issue\";N;s:8:\"\u0000*\u0000spage\";N;s:8:\"\u0000*\u0000epage\";N;s:8:\"\u0000*\u0000pages\";N;s:7:\"\u0000*\u0000issn\";N;s:8:\"\u0000*\u0000eissn\";N;s:9:\"\u0000*\u0000aulast\";N;s:10:\"\u0000*\u0000aufirst\";N;s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";N;s:9:\"\u0000*\u0000aucorp\";N;s:7:\"\u0000*\u0000isbn\";N;s:8:\"\u0000*\u0000coden\";N;s:8:\"\u0000*\u0000genre\";N;s:7:\"\u0000*\u0000part\";N;s:9:\"\u0000*\u0000btitle\";N;s:8:\"\u0000*\u0000title\";N;s:8:\"\u0000*\u0000place\";N;s:6:\"\u0000*\u0000pub\";N;s:10:\"\u0000*\u0000edition\";N;s:9:\"\u0000*\u0000tpages\";N;s:9:\"\u0000*\u0000series\";N;s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";N;}"
Unpaywall access
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1109\/TASC.2009.2039864\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:110:\"The Effects of a Stabilizer Thickness of the YBCO Coated Conductor (CC) on the Quench\/Recovery Characteristics\";s:9:\"\u0000*\u0000jtitle\";s:46:\"IEEE transactions on applied superconductivity\";s:9:\"\u0000*\u0000stitle\";s:27:\"IEEE trans. appl. supercond\";s:7:\"\u0000*\u0000date\";s:4:\"2010\";s:9:\"\u0000*\u0000volume\";s:2:\"20\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:4:\"1246\";s:8:\"\u0000*\u0000epage\";s:4:\"1249\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1051-8223\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:4:\"KWON\";s:10:\"\u0000*\u0000aufirst\";s:4:\"N. Y\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:9:{i:0;s:9:\"KIM, H. S\";i:1;s:9:\"KIM, K. L\";i:2;s:7:\"HAHN, S\";i:3;s:9:\"KIM, H.-R\";i:4;s:10:\"HYUN, O.-B\";i:5;s:9:\"KIM, H. M\";i:6;s:9:\"KIM, W. S\";i:7;s:7:\"PARK, C\";i:8;s:9:\"LEE, H. G\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:104:\"THE TWENTY-FIRST INTERNATIONAL CONFERENCE ON MAGNET TECHNOLOGY, Hefei, Anhui, China, October 18-23, 2009\";s:8:\"\u0000*\u0000title\";s:110:\"The Effects of a Stabilizer Thickness of the YBCO Coated Conductor (CC) on the Quench\/Recovery Characteristics\";s:8:\"\u0000*\u0000place\";s:12:\"New York, NY\";s:6:\"\u0000*\u0000pub\";s:49:\"Institute of Electrical and Electronics Engineers\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"4\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Europe PubMed Central access
"O:11:\"BaseOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1109\/TASC.2009.2039864\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:110:\"The Effects of a Stabilizer Thickness of the YBCO Coated Conductor (CC) on the Quench\/Recovery Characteristics\";s:9:\"\u0000*\u0000jtitle\";s:46:\"IEEE transactions on applied superconductivity\";s:9:\"\u0000*\u0000stitle\";s:27:\"IEEE trans. appl. supercond\";s:7:\"\u0000*\u0000date\";s:4:\"2010\";s:9:\"\u0000*\u0000volume\";s:2:\"20\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:4:\"1246\";s:8:\"\u0000*\u0000epage\";s:4:\"1249\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1051-8223\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:4:\"KWON\";s:10:\"\u0000*\u0000aufirst\";s:4:\"N. Y\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:9:{i:0;s:9:\"KIM, H. S\";i:1;s:9:\"KIM, K. L\";i:2;s:7:\"HAHN, S\";i:3;s:9:\"KIM, H.-R\";i:4;s:10:\"HYUN, O.-B\";i:5;s:9:\"KIM, H. M\";i:6;s:9:\"KIM, W. S\";i:7;s:7:\"PARK, C\";i:8;s:9:\"LEE, H. G\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:104:\"THE TWENTY-FIRST INTERNATIONAL CONFERENCE ON MAGNET TECHNOLOGY, Hefei, Anhui, China, October 18-23, 2009\";s:8:\"\u0000*\u0000title\";s:110:\"The Effects of a Stabilizer Thickness of the YBCO Coated Conductor (CC) on the Quench\/Recovery Characteristics\";s:8:\"\u0000*\u0000place\";s:12:\"New York, NY\";s:6:\"\u0000*\u0000pub\";s:49:\"Institute of Electrical and Electronics Engineers\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"4\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Base Search access
"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1109\/TASC.2009.2039864\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:110:\"The Effects of a Stabilizer Thickness of the YBCO Coated Conductor (CC) on the Quench\/Recovery Characteristics\";s:9:\"\u0000*\u0000jtitle\";s:46:\"IEEE transactions on applied superconductivity\";s:9:\"\u0000*\u0000stitle\";s:27:\"IEEE trans. appl. supercond\";s:7:\"\u0000*\u0000date\";s:4:\"2010\";s:9:\"\u0000*\u0000volume\";s:2:\"20\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:4:\"1246\";s:8:\"\u0000*\u0000epage\";s:4:\"1249\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1051-8223\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:4:\"KWON\";s:10:\"\u0000*\u0000aufirst\";s:4:\"N. Y\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:9:{i:0;s:9:\"KIM, H. S\";i:1;s:9:\"KIM, K. L\";i:2;s:7:\"HAHN, S\";i:3;s:9:\"KIM, H.-R\";i:4;s:10:\"HYUN, O.-B\";i:5;s:9:\"KIM, H. M\";i:6;s:9:\"KIM, W. S\";i:7;s:7:\"PARK, C\";i:8;s:9:\"LEE, H. G\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:104:\"THE TWENTY-FIRST INTERNATIONAL CONFERENCE ON MAGNET TECHNOLOGY, Hefei, Anhui, China, October 18-23, 2009\";s:8:\"\u0000*\u0000title\";s:110:\"The Effects of a Stabilizer Thickness of the YBCO Coated Conductor (CC) on the Quench\/Recovery Characteristics\";s:8:\"\u0000*\u0000place\";s:12:\"New York, NY\";s:6:\"\u0000*\u0000pub\";s:49:\"Institute of Electrical and Electronics Engineers\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"4\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
arXiv access
