The Scan&Track virtual environment
- Author
- SUDHANSHU KUMAR SEMWAL1 ; JUN OHYA2
[1] Department of Computer Science, University of Colorado at Colorado Springs, Colorado Springs, CO, 80933-7150, United States
[2] Department 1, ATR MIC Laboratories, ATR Media Integration and Communication Research Laboratories, 2-2, Hikaridai, Seika-cho, Soraku-gun, Kyoto, 619-02, Japan - Conference title
- VW '98 : virtual worlds (Paris, 1-3 July 1998)
- Conference name
- Virtual worlds. International conference (1 ; Paris 1998-07-01)
- Author (monograph)
- Heudin, Jean-Claude (Editor)
- Source
Lecture notes in computer science. 1998, pp 63-80 ; ref : 40 ref
- ISSN
- 0302-9743
- ISBN
- 3-540-64780-5
- Scientific domain
- Computer science
- Publisher
- Springer, Berlin
- Publication country
- Germany
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Analyse forme Analyse image Reconnaissance forme Reconnaissance objet Réalité virtuelle Vision ordinateur
- Keyword (en)
- Pattern analysis Image analysis Pattern recognition Object recognition Virtual reality Computer vision
- Keyword (es)
- Análisis forma Análisis imagen Reconocimiento patrón Realidad virtual Visión ordenador
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02C Artificial intelligence / 001D02C03 Pattern recognition. Digital image processing. Computational geometry
- Discipline
- Computer science : theoretical automation and systems
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2286726
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/3-540-68686-X_6 
https://dx.doi.org/10.1007/3-540-68686-X_6
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