Recombination phenomena in Si GaAs : The approach of the advanced method of transient microwave photoconductivity (AMTMP)
- Author
- CRABTCHAK, S1 ; COCIVERA, M1
[1] Guelph-Waterloo Centre for Graduate Work in Chemistry, University of Guelph, Guelph, Ontario, N1G 2W1, Canada - Conference title
- Diagnostic techniques for semiconductor materials and devices (Montreal PQ, 6-8 May 1997)
- Conference name
- Electrochemical Society symposium on diagnostic techniques for semiconductor materials and devices (Montreal PQ 1997-05-06)
- Author (monograph)
- Rai-Choudhury, P (Editor); Benton, J.L (Editor); Schroder, D.K (Editor); Shaffner, T.J (Editor)
International Society for Optical Engineering, Bellingham WA, United States (Organiser of meeting) - Source
SPIE proceedings series. 1997, pp 235-242 ; ref : 18 ref
- ISBN
- 0-8194-2765-9
- Scientific domain
- Electronics; Optics; Physics; Telecommunications
- Publisher
- Electrochemical Society, Pennington NJ
/
SPIE, Bellingham WA
- Publication country
- International
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Circuit intégré Photoconductivité transitoire Recombinaison porteur charge
- Keyword (en)
- Integrated circuit Transient photoconductivity Charge carrier recombination
- Keyword (es)
- Circuito integrado Fotoconductividad transitoria Recombinación portador carga
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2287164
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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