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Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5 K

Author
NAITOH, Yoshitaka1 ; YAN JUN LI1 ; NOMURA, Hikaru1 ; KAGESHIMA, Masami1 ; SUGAWARA, Yasuhiro1
[1] Department of Applied Physics, Graduate School of Engineering, Osaka University, Yamada-oka 2-1, Suita, Osaka 565-0871, Japan
Source

Journal of the Physical Society of Japan. = Nihon Butsuri Gakkai ōji hōkoku. 2010, Vol 79, Num 1 ; 013801.1-013801.4 ; ref : 28 ref

CODEN
JUPSAU
ISSN
0031-9015
Scientific domain
Crystallography; Mechanics acoustics; Condensed state physics; Theoretical physics
Publisher
Physical Society of Japan, Tokyo
Publication country
Japan
Document type
Article
Language
English
Author keyword
atomic force microscopy silicon surface strain surface stress
Keyword (fr)
Contrainte superficielle Dimère Dissipation Mesure sans contact Microscopie force atomique Modèle structure Silicium Structure surface Si
Keyword (en)
Surface stresses Dimers Dissipation Non contact measurement Atomic force microscopy Structural models Silicon Surface structure
Keyword (es)
Medida sin contacto
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35B Surface structure and topography

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
22975730

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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