Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5 K
- Author
- NAITOH, Yoshitaka1 ; YAN JUN LI1 ; NOMURA, Hikaru1 ; KAGESHIMA, Masami1 ; SUGAWARA, Yasuhiro1
[1] Department of Applied Physics, Graduate School of Engineering, Osaka University, Yamada-oka 2-1, Suita, Osaka 565-0871, Japan - Source
Journal of the Physical Society of Japan. = Nihon Butsuri Gakkai ōji hōkoku. 2010, Vol 79, Num 1 ; 013801.1-013801.4 ; ref : 28 ref
- CODEN
- JUPSAU
- ISSN
- 0031-9015
- Scientific domain
- Crystallography; Mechanics acoustics; Condensed state physics; Theoretical physics
- Publisher
- Physical Society of Japan, Tokyo
- Publication country
- Japan
- Document type
- Article
- Language
- English
- Author keyword
- atomic force microscopy silicon surface strain surface stress
- Keyword (fr)
- Contrainte superficielle Dimère Dissipation Mesure sans contact Microscopie force atomique Modèle structure Silicium Structure surface Si
- Keyword (en)
- Surface stresses Dimers Dissipation Non contact measurement Atomic force microscopy Structural models Silicon Surface structure
- Keyword (es)
- Medida sin contacto
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35B Surface structure and topography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 22975730
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1143/JPSJ.79.013601 
https://dx.doi.org/10.1143/JPSJ.79.013601
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