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The Use of Spatial Analysis Techniques in Defect and Nanostructure Studies

Author
MORAM, M. A1 ; GABBAI, U. E1 ; SADLER, T. C1 ; KAPPERS, M. J1 ; OLIVER, R. A1
[1] Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St., Cambridge CB2 3QZ, United Kingdom
Conference title
2009 International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP)
Conference name
International Conference on Defects - Recognition, Imaging, and Physics in Semiconductors (DRIP) (DRIP) (13 ; Oglebay, West Virginia 2009-09-13)
Author (monograph)
EDELMAN, Piotr (Editor)1
[1] Semilab SDI LLC., 3650 Spectrum Boulevard, Suite 130, Tampa, FL 33612, United States
Source

Journal of electronic materials. 2010, Vol 39, Num 6, pp 656-662, 7 p ; ref : 34 ref

CODEN
JECMA5
ISSN
0361-5235
Scientific domain
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Publisher
Springer, Heidelberg
Publication country
Germany
Document type
Conference Paper
Language
English
Author keyword
Dislocations gallium nitride indium aluminum nitride quantum dot spatial analysis
Keyword (fr)
Aluminium Autocorrélation Composé III-V Couche mince Densité élevée Dislocation Défaut Gouttelette Nanomatériau Nanostructure Nitrure d'indium Nitrure de gallium Ordre courte distance Point quantique Réseau(arrangement) Semiconducteur III-V 6172L 8107T GaN InGaN
Keyword (en)
Aluminium Autocorrelations III-V compound Thin films High density Dislocations Defects Droplets Nanostructured materials Nanostructures Indium nitride Gallium nitride Short-range order Quantum dots Arrays III-V semiconductors
Keyword (es)
Compuesto III-V Densidad elevada Indio nitruro Galio nitruro
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72L Linear defects: dislocations, disclinations

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A07 Nanoscale materials and structures: fabrication and characterization / 001B80A07T Quantum dots

Discipline
Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
22996949

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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