Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction
- Autor
- CHEN, Q1 2 ; MAO, W. G1 2 ; ZHOU, Y. C1 2 ; LU, C3
[1] Faculty of Materials, Optoelectronics and Physics, Xiangtan University, Hunan 411105, China
[2] Key Laboratory of Low Dimensional Materials & Application Technology, Ministry of Education, Xiangtan University, Hunan 411105, China
[3] Department of Mechanical Engineering, Curtin University of Technology, Western Australia 6845, Australia - Fuente
Applied surface science. 2010, Vol 256, Num 23, pp 7311-7315, 5 p ; ref : 38 ref
- Editor
- Elsevier, Amsterdam
- País de la publicación
- Netherlands
- Tipo de documento
- Article
- Idioma
- English
- Palabra clave de autor
- Residual stress Thermal barrier coatings X-ray diffraction Young's modulus
- Palabra clave (fr)
- Contrainte résiduelle Cyclage thermique Diffraction RX Frittage Loi Weibull Matériau poreux Mesure contrainte Microstructure Module Young Nanoindentation Oxyde d'yttrium Oxyde de zirconium Projection plasma Revêtement barrière thermique Zircone stabilisée Y2O3 ZrO2 Composé de métal de transition Composé minéral
- Palabra clave (in)
- Residual stresses Thermal cycling XRD Sintering Weibull distribution Porous materials Stress measurement Microstructure Young modulus Nanoindentation Yttrium oxide Zirconium oxide Plasma arc spraying Thermal barrier coatings Stabilized zirconia Transition element compounds Inorganic compounds
- Palabra clave (es)
- Nanoindentacion Ytrio óxido Zirconio óxido Zircona estabilizada
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A10 X-ray diffraction and scattering / 001B60A10N Single-crystal and powder diffraction
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H60 Physical properties of thin films, nonelectronic / 001B60H60B Mechanical and acoustical properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A16 Methods of nanofabrication / 001B80A16N Nanolithography
- Disciplina
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 23054584
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.apsusc.2010.05.071 
https://dx.doi.org/10.1016/j.apsusc.2010.05.071
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