Effect of film thickness on the optical constants and optical absorption properties of NiOx thin films
- Author
- YING ZHOU1 2 ; YONGYOU GENG1 ; DONGHONG GU1 ; WEIBING GU1 2 ; ZHI JIANG1 2
[1] Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
[2] Graduate School of the Chinese Academy of Sciences, Beijing 100049, China - Source
Physica. B, Condensed matter. 2010, Vol 405, Num 18, pp 3875-3878, 4 p ; ref : 24 ref
- ISSN
- 0921-4526
- Scientific domain
- Crystallography; Condensed state physics
- Publisher
- Elsevier, Kidlington
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- Annealing Film thickness NiOx thin films Optical band gap Optical constants
- Keyword (fr)
- Bande interdite Constante optique Couche mince Epaisseur Facteur réflexion Indice extinction Indice réfraction Oxyde de nickel Pulvérisation cathodique Pulvérisation réactive Recuit Spectre absorption Transition permise
- Keyword (en)
- Energy gap Optical constants Thin films Thickness Reflectivity Extinction index Refractive index Nickel oxide Cathode sputtering Reactive sputtering Annealing Absorption spectra Allowed transition
- Keyword (es)
- Níquel óxido Transición permitida
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films / 001B70H66L Other semiconductors
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 23117603
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.physb.2007.02.100 
https://dx.doi.org/10.1016/j.physb.2007.02.100
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