Effects of temperature on structural and morphological features of CoPc and CoPcF16 thin films
- Author
- SCHUSTER, Britt-Elfriede1 ; BASOVA, Tamara V2 ; PLYASHKEVICH, Vladimir A2 ; PEISERT, Heiko1 ; CHASSE, Thomas1
[1] Institute of Physical and Theoretical Chemistry, University of Tübingen, Germany
[2] Nikolaev Institute of Inorganic Chemistry, Novosihirsk, Russian Federation - Source
Thin solid films. 2010, Vol 518, Num 23, pp 7161-7166, 6 p ; ref : 55 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- Russian
- Author keyword
- Atomic Force Microscopy Metal Phthalocyanines Morphology Optical absorption spectroscopy Raman spectroscopy Thin films X-ray diffraction
- Keyword (fr)
- Absorption optique Cobalt Composition phase Couche mince Cristallinité Diffraction RX Effet température Epitaxie jet moléculaire Microscopie force atomique Morphologie Mécanisme croissance Orientation moléculaire Orientation préférentielle Phtalocyanine Spectre absorption Spectrométrie Raman 6855A 6855J 6855N 8115H
- Keyword (en)
- Optical absorption Cobalt Phase composition Thin films Crystallinity XRD Temperature effects Molecular beam epitaxy Atomic force microscopy Morphology Growth mechanism Molecular orientation Preferred orientation Phthalocyanines Absorption spectra Raman spectroscopy
- Keyword (es)
- Absorción óptica Composición fase Cristalinidad Mecanismo crecimiento Orientación preferencial
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55N Composition and phase identification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15A Theory and models of film growth
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15H Molecular, atomic, ion, and chemical beam epitaxy
- Discipline
- Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 23253297
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2010.06.030 
https://dx.doi.org/10.1016/j.tsf.2010.06.030
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