Barrier height determination for n-type 4H-SiC schottky contacts made using various metals
- Author
- YAKIMOVA, R1 ; HEMMINGSSON, C1 ; MACMILLAN, M. F1 ; YAKIMOV, T1 ; JANZEN, E1
[1] Department of Physics and Measurement Technology, Linköping University, 581 83 Linköping, Sweden - Source
Journal of electronic materials. 1998, Vol 27, Num 7, pp 871-875 ; ref : 17 ref
- CODEN
- JECMA5
- ISSN
- 0361-5235
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Barrière Schottky Chrome Etat défaut Etat interface Etude expérimentale Hauteur barrière Molybdène Nickel Or Piège Silicium carbure Tantale Travail sortie Tungstène Au C Si Cr Mo Ni SiC Ta W
- Keyword (en)
- Schottky barriers Chromium Defect states Interface states Experimental study Barrier height Molybdenum Nickel Gold Traps Silicon carbides Tantalum Work functions Tungsten
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C30 Surface double layers, schottky barriers, and work functions
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2326276
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/s11664-998-0112-5 
https://dx.doi.org/10.1007/s11664-998-0112-5
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