Modelling the colour of a coated rough steel surface
- Author
- GOOSSENS, V1 ; STIJNS, E2 ; VAN GILS, S3 ; FINSY, R4 ; TERRYN, H1
[1] Materials and Chemistry, Vrije Universiteit Brussel, Pleinlaan 2, 1050 Brussel, Belgium
[2] Applied Physics and Photonics, Vrije Universiteit Brussel, Pleinlaan 2, 1050 Brussel, Belgium
[3] ArcelorMittal Global R&D Gent, OCAS nv, John Kennedylaan 3, 9060 Zelzate, Belgium
[4] Physics and Colloidal Chemistry, Vrije Universiteit Brussel, Pleinlaan 2, 1050 Brussel, Belgium - Conference title
- Optical micro- and nanometrology in microsystems technology III (13-16 April 2010, Brussels, Belgium)
- Conference name
- Optical micro- and nanometrology (03 ; Brussels 2010)
- Author (monograph)
- Gorecki, Christophe (Editor); Asundi, Anand (Editor); Osten, Wolfgang (Editor)
SPIE, United States (Organiser of meeting)
B-PHOT-Brussels Photonics Team, Belgium (Organiser of meeting)
Comité belge d'optique, Belgium (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7718 ; 77180L.1-77180L.7 ; ref : 9 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-8191-7
- Scientific domain
- Electronics; Metrology and instrumentation; Optics; Physics
- Publisher
- SPIE, Bellingham Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Acier Diffusion lumière Epaisseur optique Méthode mesure Méthode optique Rugosité Spectrophotomètre Surface rugueuse 0130C 0760 4225F Métrologie optique Surface métallique
- Keyword (en)
- Steels Light scattering Optical thickness Measuring methods Optical method Roughness Spectrophotometers Rough surfaces Optical metrology
- Keyword (es)
- Espesor óptico Método óptico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25F Diffraction and scattering
- Discipline
- Metrology Physics : optics Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 23399972
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1117/12.853844 
https://dx.doi.org/10.1117/12.853844
