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Modelling the colour of a coated rough steel surface

Author
GOOSSENS, V1 ; STIJNS, E2 ; VAN GILS, S3 ; FINSY, R4 ; TERRYN, H1
[1] Materials and Chemistry, Vrije Universiteit Brussel, Pleinlaan 2, 1050 Brussel, Belgium
[2] Applied Physics and Photonics, Vrije Universiteit Brussel, Pleinlaan 2, 1050 Brussel, Belgium
[3] ArcelorMittal Global R&D Gent, OCAS nv, John Kennedylaan 3, 9060 Zelzate, Belgium
[4] Physics and Colloidal Chemistry, Vrije Universiteit Brussel, Pleinlaan 2, 1050 Brussel, Belgium
Conference title
Optical micro- and nanometrology in microsystems technology III (13-16 April 2010, Brussels, Belgium)
Conference name
Optical micro- and nanometrology (03 ; Brussels 2010)
Author (monograph)
Gorecki, Christophe (Editor); Asundi, Anand (Editor); Osten, Wolfgang (Editor)
SPIE, United States (Organiser of meeting)
B-PHOT-Brussels Photonics Team, Belgium (Organiser of meeting)
Comité belge d'optique, Belgium (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7718 ; 77180L.1-77180L.7 ; ref : 9 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-8191-7
Scientific domain
Electronics; Metrology and instrumentation; Optics; Physics
Publisher
SPIE, Bellingham Wash
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Acier Diffusion lumière Epaisseur optique Méthode mesure Méthode optique Rugosité Spectrophotomètre Surface rugueuse 0130C 0760 4225F Métrologie optique Surface métallique
Keyword (en)
Steels Light scattering Optical thickness Measuring methods Optical method Roughness Spectrophotometers Rough surfaces Optical metrology
Keyword (es)
Espesor óptico Método óptico
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings

Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25F Diffraction and scattering

Discipline
Metrology Physics : optics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
23399972

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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