Insulator characterisation by using a scanning electron microscope. Measurement principles and examples
- Author
- LEO Electron Microscopy Ltd, Cambridge, United KingdomSociété française du vide (Funder/Sponsor)
- Conference title
- CSC'3 International Conference on Electric Charge in Solid Insulators
- Conference name
- CSC'3 International Conference on Electric Charge in Solid Insulators (3 ; Tours 1998-06-29)
- Author (monograph)
- DAMAMME, Gilles (Editor)1
Société française du vide, Paris, France (Funder/Sponsor)
[1] CEA Centre d'études du Ripault, 37260 Monts, France - Source
Le Vide (1995). 1998, Vol 53, Num 287, pp 429-434 ; SUP ; ref : 18 ref
- ISSN
- 1266-0167
- Scientific domain
- Chemical engineering; Metallurgy, welding
- Publisher
- Société française du vide, Paris
- Publication country
- France
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Article synthèse Caractérisation Charge espace Diélectrique Injection porteur charge Isolant électrique Piégeage porteur charge Relaxation diélectrique
- Keyword (en)
- Reviews Characterization Space charge Dielectric materials Charge carrier injection Electric insulating material Charge carrier trapping Dielectric relaxation
- Keyword (es)
- Caracterización Dieléctrico Inyección portador carga Aíslante eléctrico Captura portador carga
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70G Dielectrics, piezoelectrics, and ferroelectrics and their properties / 001B70G22 Dielectric properties of solids and liquids / 001B70G22J Dielectric breakdown and space-charge effects
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2340652
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Install on your browser
"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:103:\"Insulator characterisation by using a scanning electron microscope. Measurement principles and examples\";s:9:\"\u0000*\u0000jtitle\";s:14:\"Le Vide (1995)\";s:9:\"\u0000*\u0000stitle\";s:11:\"Vide (1995)\";s:7:\"\u0000*\u0000date\";s:4:\"1998\";s:9:\"\u0000*\u0000volume\";s:2:\"53\";s:8:\"\u0000*\u0000issue\";s:3:\"287\";s:8:\"\u0000*\u0000spage\";s:3:\"429\";s:8:\"\u0000*\u0000epage\";s:3:\"434\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1266-0167\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";N;s:10:\"\u0000*\u0000aufirst\";N;s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:3:\"SUP\";s:9:\"\u0000*\u0000btitle\";s:69:\"CSC'3 International Conference on Electric Charge in Solid Insulators\";s:8:\"\u0000*\u0000title\";s:103:\"Insulator characterisation by using a scanning electron microscope. Measurement principles and examples\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:28:\"Soci\u00e9t\u00e9 fran\u00e7aise du vide\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:0;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:103:\"Insulator characterisation by using a scanning electron microscope. Measurement principles and examples\";s:9:\"\u0000*\u0000jtitle\";s:14:\"Le Vide (1995)\";s:9:\"\u0000*\u0000stitle\";s:11:\"Vide (1995)\";s:7:\"\u0000*\u0000date\";s:4:\"1998\";s:9:\"\u0000*\u0000volume\";s:2:\"53\";s:8:\"\u0000*\u0000issue\";s:3:\"287\";s:8:\"\u0000*\u0000spage\";s:3:\"429\";s:8:\"\u0000*\u0000epage\";s:3:\"434\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1266-0167\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";N;s:10:\"\u0000*\u0000aufirst\";N;s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:3:\"SUP\";s:9:\"\u0000*\u0000btitle\";s:69:\"CSC'3 International Conference on Electric Charge in Solid Insulators\";s:8:\"\u0000*\u0000title\";s:103:\"Insulator characterisation by using a scanning electron microscope. Measurement principles and examples\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:28:\"Soci\u00e9t\u00e9 fran\u00e7aise du vide\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:0;}"
Istex access
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:103:\"Insulator characterisation by using a scanning electron microscope. Measurement principles and examples\";s:9:\"\u0000*\u0000jtitle\";s:14:\"Le Vide (1995)\";s:9:\"\u0000*\u0000stitle\";s:11:\"Vide (1995)\";s:7:\"\u0000*\u0000date\";s:4:\"1998\";s:9:\"\u0000*\u0000volume\";s:2:\"53\";s:8:\"\u0000*\u0000issue\";s:3:\"287\";s:8:\"\u0000*\u0000spage\";s:3:\"429\";s:8:\"\u0000*\u0000epage\";s:3:\"434\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1266-0167\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";N;s:10:\"\u0000*\u0000aufirst\";N;s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:3:\"SUP\";s:9:\"\u0000*\u0000btitle\";s:69:\"CSC'3 International Conference on Electric Charge in Solid Insulators\";s:8:\"\u0000*\u0000title\";s:103:\"Insulator characterisation by using a scanning electron microscope. Measurement principles and examples\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:28:\"Soci\u00e9t\u00e9 fran\u00e7aise du vide\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:0;}"
Europe PubMed Central access
"O:11:\"BaseOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:103:\"Insulator characterisation by using a scanning electron microscope. Measurement principles and examples\";s:9:\"\u0000*\u0000jtitle\";s:14:\"Le Vide (1995)\";s:9:\"\u0000*\u0000stitle\";s:11:\"Vide (1995)\";s:7:\"\u0000*\u0000date\";s:4:\"1998\";s:9:\"\u0000*\u0000volume\";s:2:\"53\";s:8:\"\u0000*\u0000issue\";s:3:\"287\";s:8:\"\u0000*\u0000spage\";s:3:\"429\";s:8:\"\u0000*\u0000epage\";s:3:\"434\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1266-0167\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";N;s:10:\"\u0000*\u0000aufirst\";N;s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:3:\"SUP\";s:9:\"\u0000*\u0000btitle\";s:69:\"CSC'3 International Conference on Electric Charge in Solid Insulators\";s:8:\"\u0000*\u0000title\";s:103:\"Insulator characterisation by using a scanning electron microscope. Measurement principles and examples\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:28:\"Soci\u00e9t\u00e9 fran\u00e7aise du vide\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:0;}"
Base Search access
"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:103:\"Insulator characterisation by using a scanning electron microscope. Measurement principles and examples\";s:9:\"\u0000*\u0000jtitle\";s:14:\"Le Vide (1995)\";s:9:\"\u0000*\u0000stitle\";s:11:\"Vide (1995)\";s:7:\"\u0000*\u0000date\";s:4:\"1998\";s:9:\"\u0000*\u0000volume\";s:2:\"53\";s:8:\"\u0000*\u0000issue\";s:3:\"287\";s:8:\"\u0000*\u0000spage\";s:3:\"429\";s:8:\"\u0000*\u0000epage\";s:3:\"434\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1266-0167\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";N;s:10:\"\u0000*\u0000aufirst\";N;s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:3:\"SUP\";s:9:\"\u0000*\u0000btitle\";s:69:\"CSC'3 International Conference on Electric Charge in Solid Insulators\";s:8:\"\u0000*\u0000title\";s:103:\"Insulator characterisation by using a scanning electron microscope. Measurement principles and examples\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:28:\"Soci\u00e9t\u00e9 fran\u00e7aise du vide\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:0;}"
arXiv access
