Insulator characterisation by using a scanning electron microscope : Application to electrical insulation and to mechanics
- Author
- LEO Electron Microscopy Ltd, Cambridge, United KingdomSociété française du vide (Funder/Sponsor)
- Conference title
- CSC'3 International Conference on Electric Charge in Solid Insulators
- Conference name
- CSC'3 International Conference on Electric Charge in Solid Insulators (3 ; Tours 1998-06-29)
- Author (monograph)
- DAMAMME, Gilles (Editor)1
Société française du vide, Paris, France (Funder/Sponsor)
[1] CEA Centre d'études du Ripault, 37260 Monts, France - Source
Le Vide (1995). 1998, Vol 53, Num 287, pp 464-471 ; SUP ; ref : 26 ref
- ISSN
- 1266-0167
- Scientific domain
- Chemical engineering; Metallurgy, welding
- Publisher
- Société française du vide, Paris
- Publication country
- France
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Alumine Article synthèse Caractérisation Disruption électrique Décharge disruptive Défaut Electrostatique Injection porteur charge Isolant électrique Piégeage porteur charge Propriété mécanique SEM Usure Zircone
- Keyword (en)
- Alumina Reviews Characterization Electric breakdown Flashover Defects Electrostatics Charge carrier injection Electric insulating material Charge carrier trapping Mechanical properties SEM Wear Zirconia
- Keyword (es)
- Caracterización Inyección portador carga Aíslante eléctrico Captura portador carga Zircona
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70G Dielectrics, piezoelectrics, and ferroelectrics and their properties / 001B70G22 Dielectric properties of solids and liquids / 001B70G22J Dielectric breakdown and space-charge effects
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2340657
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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