Integrated Streak Camera in Standard (Bi)CMOS Technology
- Author
- UHRING, Wilfried; LE NORMAND, Jean-Pierre; ZINT, Virginie; ZLATANSKI, Martin1
[1] Laboratoire InESS, 23 rue du Loess, Strasbourg, 67037, France - Conference title
- Silicon photonics and photonic integrated circuits II (12-16 April 2010, Brussels, Belgium)
- Conference name
- Silicon photonics and photonic integrated circuits (02 ; Brussels 2010)
- Author (monograph)
- Righini, Giancarlo C (Editor)
SPIE, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7719 ; 1Vol ; 77190V.1-77190V.13 ; ref : 32 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 0-8194-8192-0 978-0-8194-8192-4
- Scientific domain
- Electronics; Metrology and instrumentation; Optics; Physics
- Publisher
- SPIE, Bellingham, Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Appareillage Caméra défilement continu Domaine temps ns Domaine temps ps Echantillonnage Grande vitesse Imageur Interface utilisateur Matrice M Méthode mesure Optoélectronique Photodétecteur Picoseconde Pixel Rayonnement visible Répartition spatiale Résolution spatiale Résolution temporelle Taux échantillonnage Technologie MOS complémentaire 0130C 8560G Photonique
- Keyword (en)
- Instrumentation Streak cameras ns range ps range Sampling High speed Imager User interfaces M matrix Measuring methods Optoelectronics Photodetectors Picosecond Pixel Visible radiation Spatial distribution Spatial resolution Time resolution Sampling rate Complementary MOS technology Photonics
- Keyword (es)
- Muestreo Gran velocidad Imager Matriz M Optoelectrónica Picosegundo Pixel Razón muestreo Tecnología MOS complementario
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F15 Optoelectronic devices
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F16 Imaging devices
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D04 Telecommunications and information theory / 001D04A Information, signal and communications theory / 001D04A04 Signal and communications theory / 001D04A04C Sampling, quantization
- Discipline
- Electronics Telecommunications and information theory Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 23444777
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1117/12.853911 
https://dx.doi.org/10.1117/12.853911
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