Effect of 193 and 157 nm laser light illumination on the surface properties of TMOS-NiCl2 sol-gel derived material
- Author
- ATHANASEKOS, L1 2 ; KOLLIA, Z1 ; VASILEIADIS, M1 2 ; ASPIOTIS, N2 ; ALEXANDROPOULOS, D2 ; MERISTOUDI, A1 ; KAROUTSOS, V2 ; SARANTOPOULOU, E1
[1] National Hellenic Research Foundation-NHRF, Theoretical and Physical Chemistry Institute-TPCI, 48 Vas. Constantinou Ave, Athens 11635, Greece
[2] Department of Materials Science, University of Patras, Patras 26504, Greece - Issue title
- Light-induced material organization
- Author (monograph)
- VAINOS, Nikos (Editor)1 2 ; RODE, Andrei V (Editor)3
[1] University of Patras, Greece
[2] National Hellenic Research Foundation, Athens, Greece
[3] Australian National University, Canberra, Australia - Source
Journal of optics (Print). 2010, Vol 12, Num 12 ; 124015.1-124015.7 ; ref : 27 ref
- Publisher
- IOP, Philadelphia, Pa
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- direct laser structuring excimer laser materials processing micromachining photonics sol-gel composites surface morphology
- Keyword (fr)
- Application laser Couche mince Dispositif optoélectronique Imagerie Laser UV Laser excimère Laser gaz Matériau composite Matériau optique Microscopie force atomique Microusinage Morphologie surface Nanoparticule Nanostructure Procédé sol gel Propriété optique Propriété surface Traitement par laser 0779L 4255L 4262C 4270 Photonique
- Keyword (en)
- Laser beam applications Thin films Optoelectronic devices Imagery Ultraviolet laser Excimer lasers Gas lasers Composite materials Optical materials Atomic force microscopy Micromachining Surface morphology Nanoparticles Nanostructures Sol-gel process Optical properties Surface properties Laser assisted processing Photonics
- Keyword (es)
- Imaginería Laser UV
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G79 Scanning probe microscopes, components and techniques / 001B00G79L Atomic force microscopes
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B55 Lasers / 001B40B55L Gas lasers including excimer and metal-vapor lasers
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B62 Biological and medical applications / 001B40B62C Industrial applications
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B70 Optical materials
- Discipline
- Metrology Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 23728351
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1088/2040-8978/12/12/124015 
https://dx.doi.org/10.1088/2040-8978/12/12/124015
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