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The critical magnetic field of a superconductor with 4-fermion attraction weakly perturbed by magnetic impurities

Author
BORYCKI, D1 ; MACKOWIAK, Jan1
[1] Uniwersytet M. Kopernika ul. Grudziądzka 5, 87-100 Toruń, Poland
Conference title
Proceedings of the 9th International Conference on Materials and Mechanisms of Superconductivity. M2S-IX: Tokyo, Japan, September 7-12, 2009
Conference name
International Conference on Materials and Mechanisms of Superconductivity. M2S-IXe (9 ; Tokyo 2009-09-07)
Author (monograph)
OGATA, Masao (Editor)1
[1] University of Tokyo, Japan
Source

Physica. C. Superconductivity. 2010, Vol 470, Num SUP1 ; S925-S927 ; ref : 19 ref

ISSN
0921-4534
Scientific domain
Crystallography; Electronics; Electrical engineering; Condensed state physics
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Author keyword
Fermion quadruples Magnetic impurities Reduced s-d interaction Superconductivity
Keyword (fr)
Approximation champ moyen Bande interdite Champ critique Energie libre Hamiltonien Impureté magnétique Interaction attraction Interaction longue distance Sous système Supraconducteur
Keyword (en)
Mean field approximation Energy gap Critical field Free energy Hamiltonians Magnetic impurities Attraction interaction Long range interaction Subsystem Superconductors
Keyword (es)
Aproximación campo medio Interacción atracción Interacción larga distancia Subsistema
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70D Superconductivity / 001B70D25 Properties of type I and type II superconductors / 001B70D25J Electronic structure

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
23729022

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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