Morphology control of 1D ZnO nanostructures grown by metal-organic chemical vapor deposition
- Author
- DONG CHAN KIM1 ; BO HYUN KONG1 ; HYUNG KOUN CHO1
[1] School of Advanced Materials Science and Engineering, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do 440-746, Korea, Republic of - Conference title
- Selection of Papers From the 2007 Semiconducting and Insulating Materials Conference (SIMC-XIV)
- Conference name
- International Semiconducting and Insulating Materials Conference (SIMC-XIV) (SIMC-XIV) (14 ; Fayetteville 2007-05-15)
- Author (monograph)
- WANG, Zhiming M (Editor)1 ; KIESEL, Peter (Editor)2
[1] University of Arkansas, Physics Building Room 222, Fayetteville, AK 72701, United States
[2] Palo Alto Research Center, 3333, Coyote Hills Rd, Palo Alto, CA 94304, United States - Source
Journal of materials science. Materials in electronics. 2008, Vol 19, Num 8-9, pp 760-763, 4 p ; ref : 28 ref
- ISSN
- 0957-4522
- Scientific domain
- Electronics; Condensed state physics
- Publisher
- Springer, Norwell, MA
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Alignement vertical Effet température Fabrication microélectronique Microscopie électronique balayage Microstructure Méthode MOCVD Nanobâtonnet Nanostructure Orbitale frontière Oxyde de zinc 0779 6865 8107D 8540H ZnO Composé II-VI
- Keyword (en)
- Vertical alignment Temperature effects Microelectronic fabrication Scanning electron microscopy Microstructure MOCVD Nanorod Nanostructures Frontier orbital Zinc oxide II-VI compound
- Keyword (es)
- Alineacíon vertical Fabricación microeléctrica Nanopalito Orbital frontera Zinc óxido Compuesto II-VI
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G79 Scanning probe microscopes, components and techniques
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H65 Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15G Chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.)
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F17 Microelectronic fabrication (materials and surfaces technology)
- Discipline
- Electronics Metrology Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 23743794
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/s10854-007-9404-4 
https://dx.doi.org/10.1007/s10854-007-9404-4
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