Interactions of low-energy coherent electron beams with nano-scale objects : a study by Fresnel projection microscopy
- Author
- VU THIEN BINH1 ; SEMET, V1
[1] Laboratoire d'Emission Electronique, DPM-CNRS, Université Claude Bernard Lyon 1, 69622, Villeurbanne, France - Conference title
- Field Emission '97 International Field Emission Symposium
- Conference name
- Field Emission '97 International Field Emission Symposium (44 ; Tsukuba 1997-07-07)
- Author (monograph)
- HONO, K (Editor)1 ; TSUKADA, M (Editor)2
International Field Emission Society, International (Funder/Sponsor)
NRIM National Research Institute for Metals, Tsukuba, Japan (Funder/Sponsor)
[1] National Resarch Institute for Metals, Tsukuba, Japan
[2] University of Tokyo, Tokyo, Japan - Source
Ultramicroscopy. 1998, Vol 73, Num 1-4, pp 107-117 ; ref : 16 ref
- CODEN
- ULTRD6
- ISSN
- 0304-3991
- Scientific domain
- Cell biology, histology; Crystallography; Physics
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Diffraction Fresnel Etude expérimentale Microscopie électronique émission champ Nanostructure Objet phase Pointe microscope Résolution image Source électron Microscopie projection Objet opaque Objet transparent
- Keyword (en)
- Fresnel diffraction Experimental study Field emission electron microscopy Nanostructures Phase object Microscope tips Image resolution Electron sources Projection microscopy
- Keyword (es)
- Objeto fase
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G77 Atomic, molecular and charged-particle sources and detectors / 001B00G77K Charged-particle beam sources and detectors
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G78 Electron, positron and ion microscopes, electron diffractometers and related techniques
- Discipline
- Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2375304
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0304-3991(97)00143-5 
https://dx.doi.org/10.1016/S0304-3991(97)00143-5
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