Influence of the polar angle of incidence on secondary ion formation in self-sputtering of silver
- Author
- WEIDTMANN, B1 ; HANKE, S1 ; DUVENBECK, A1 ; WUCHER, A1
[1] Department of Physics, University Duisburg-Essen, 47048 Duisburg, Germany - Conference title
- Proceedings of the Seventeenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVII. Toronto, Ontario, Canada, September 14-18, 2009
- Conference name
- International Conference on Secondary Ion Mass SPectrometry, SIMS XVII (17 ; Toronto 2009-09-14)
- Author (monograph)
- CLARK, Paula A (Editor)2 ; GARDELLA, Joseph A (Editor)1
[1] University at Buffalo, United States
[2] Department of Chemistry Muhlenberg College, Muhlenberg, PA, United States - Source
Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 24-27, 4 p ; ref : 17 ref
- CODEN
- SIANDQ
- ISSN
- 0142-2421
- Scientific domain
- General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
- Publisher
- Wiley, Chichester
- Publication country
- United Kingdom
- Document type
- Conference Paper
- Language
- English
- Author keyword
- angle dependence collision ion formation silver sputtering
- Keyword (fr)
- Angle incidence Approximation électron libre Argent Cinétique Equation vitesse Etat amorphe Frottement Ionisation Métal transition Méthode dynamique moléculaire Pulvérisation irradiation Simulation ordinateur Transfert charge Ag
- Keyword (en)
- Incidence angle Free electron approximation Silver Kinetics Rate equation Amorphous state Friction Ionization Transition elements Molecular dynamics method Sputtering Computerized simulation Charge transfer
- Keyword (es)
- Ecuación velocidad Transferencia carga
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70I Electron and ion emission by liquids and solids; impact phenomena / 001B70I20 Impact phenomena (including electron spectra and sputtering) / 001B70I20R Atomic, molecular, and ion beam impact and interactions with surfaces
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80C Rheology / 001B80C10 Fundamentals and general
- Discipline
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 23798345
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/sia.3403 
https://dx.doi.org/10.1002/sia.3403
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