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Molecular depth profiling of polystyrene by electrospray droplet impact

Author
SAKAI, Yuji1 3 ; LIJIMA, Yoshitoki2 ; MUKOU, Souichirou1 ; HIRAOKA, Kenzo1
[1] Clean Energy Research Center, University of Yamonashi, Takeda 4-3-11, Kofu 400-8511, Japan
[2] Electron Optics Sales Division, JEOL Ltd.2-8-3 Akebono, Tochikawa, Tokyo 190-0012, Japan
[3] Japan Science and Technology Agency, Innovation Satellite Shizuoka, 3-5-1 Johoku, Nakoku, Hamamatsu, 432-8561, Japan
Conference title
Proceedings of the Seventeenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVII. Toronto, Ontario, Canada, September 14-18, 2009
Conference name
International Conference on Secondary Ion Mass SPectrometry, SIMS XVII (17 ; Toronto 2009-09-14)
Author (monograph)
CLARK, Paula A (Editor)2 ; GARDELLA, Joseph A (Editor)1
[1] University at Buffalo, United States
[2] Department of Chemistry Muhlenberg College, Muhlenberg, PA, United States
Source

Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 167-170, 4 p ; ref : 11 ref

CODEN
SIANDQ
ISSN
0142-2421
Scientific domain
General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Wiley, Chichester
Publication country
United Kingdom
Document type
Conference Paper
Language
English
Author keyword
damage-free etching electrospray droplet impact molecular depth profiling polystyrene
Keyword (fr)
Eau Electrospray Endommagement Energie cinétique Gouttelette Gravure Profil profondeur SIMS Silicium Spectre photoélectron RX Styrène polymère
Keyword (en)
Water Electrospray Damage Kinetic energy Droplets Etching Depth profiles SIMS Silicon X-ray photoelectron spectra Polystyrene
Keyword (es)
Electrospray
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70I Electron and ion emission by liquids and solids; impact phenomena / 001B70I20 Impact phenomena (including electron spectra and sputtering) / 001B70I20R Atomic, molecular, and ion beam impact and interactions with surfaces

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A70 Materials testing

Pacs
8170J Chemical composition analysis, chemical depth and dopant profiling

Discipline
Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
23798381

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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