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The Storing Matter technique: Application to polymer samples using Ag collectors

Author
BECKER, N1 ; WIRTZ, T1 ; MIGEON, H.-N1
[1] Department Science and Analysis of Materials (SAM), Centre de Recherche Public-Gabriel Lippmann, 41 rue du Brill, 4422 Belvaux, Luxembourg
Conference title
Proceedings of the Seventeenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVII. Toronto, Ontario, Canada, September 14-18, 2009
Conference name
International Conference on Secondary Ion Mass SPectrometry, SIMS XVII (17 ; Toronto 2009-09-14)
Author (monograph)
CLARK, Paula A (Editor)2 ; GARDELLA, Joseph A (Editor)1
[1] University at Buffalo, United States
[2] Department of Chemistry Muhlenberg College, Muhlenberg, PA, United States
Source

Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 413-416, 4 p ; ref : 7 ref

CODEN
SIANDQ
ISSN
0142-2421
Scientific domain
General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Wiley, Chichester
Publication country
United Kingdom
Document type
Conference Paper
Language
English
Author keyword
Storing Matter technique ToF-SIMS cationization fragmentation polymer silver
Keyword (fr)
Analyse quantitative Analyse surface Argent Couche mince Découplage Evaporation faisceau électronique Faisceau ion Fragmentation Ionisation Polymère Pulvérisation irradiation SIMS Surcouche Travail sortie Ultravide Ag
Keyword (en)
Quantitative chemical analysis Surface analysis Silver Thin films Decoupling Electron beam evaporation Ion beams Fragmentation Ionization Polymers Sputtering SIMS Overlayers Work functions Ultrahigh vacuum
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70I Electron and ion emission by liquids and solids; impact phenomena / 001B70I20 Impact phenomena (including electron spectra and sputtering) / 001B70I20R Atomic, molecular, and ion beam impact and interactions with surfaces

Pacs
7920R Atomic, molecular, and ion beam impact and interactions with surfaces

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
23798441

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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