The ROCS Workshop and 25 years of compound semiconductor reliability
- Author
- ROESCH, William J1
[1] TriQuint Semiconductor, Inc., 2300 N.E. Brookwood Parkway, Hillsboro, Oregon 97124-5300, United States - Conference name
- 2010 ROCS (Reliability Of Compound Semiconductors) workshop (Reliability Of Compound Semiconductors) workshop (Portland, Oregon 2010-05-17)
- Source
Microelectronics and reliability. 2011, Vol 51, Num 2, pp 188-194, 7 p ; ref : 5 ref
- CODEN
- MCRLAS
- ISSN
- 0026-2714
- Scientific domain
- Electronics
- Publisher
- Elsevier, Kidlington
- Publication country
- United Kingdom
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Aspect historique Fiabilité dispositif semiconducteur
- Keyword (en)
- Historical aspects Semiconductor device reliability
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03C Materials
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 23825079
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.microrel.2010.09.005 
https://dx.doi.org/10.1016/j.microrel.2010.09.005
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