Moire fringe method of using warping deformation measurement of electronic components
- Author
- HUANG YANPING1 ; HUANG BIAOBING2 ; XU HONGJI1 ; YAN DONGMEI3 ; LI WENPENG4
[1] Changchun University of Science and Technology, China
[2] Changchun Institute of Technology, China
[3] Jilin University, China
[4] Jilin Urban Water Supply Company, China - Conference title
- Design, manufacturing, and testing of micro- and nano-optical devices and systems (26-29 April 2010, Dalian China)
- Conference name
- International symposium on advanced optical manufacturing and testing technologies (05 ; Dalain 2010)
- Author (monograph)
- Tianchun Ye (Editor); Sen Han (Editor); Kameyama, Masaomi (Editor); Song Hu (Editor)
Chinese Optical Society, China (Organiser of meeting)
Institute of Optics and Electronics, China (Organiser of meeting)
SPIE, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7657 ; 76571K.1-76571K.6 ; ref : 5 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-8087-3
- Scientific domain
- Electronics; Optics; Physics
- Publisher
- SPIE, Bellingham WA
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Contrainte résiduelle Diffraction onde électromagnétique Fiabilité Frange moiré Grande vitesse Mesure déformation Méthode mesure Méthode moiré Réseau diffraction 0130C 4225F 4230M 4279D 4287
- Keyword (en)
- Residual stresses Electromagnetic wave diffraction Reliability Moire fringes High speed Strain measurement Measuring methods Moire method Diffraction gratings
- Keyword (es)
- Gran velocidad Método muaré
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25F Diffraction and scattering
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30M Speckle and moire patterns
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B87 Optical testing techniques
- Discipline
- Physics : optics Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 23847912
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1117/12.866630 
https://dx.doi.org/10.1117/12.866630
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