Calibration and image enhancement algorithm of portable structured light 3D gauge system for improving accuracy
- Author
- LI TAO1 ; KEVIN HARDING2 ; MING JIA1 ; GUIJU SONG1
[1] GE Global Research Center, SHANGHAI, 201203, China
[2] GE Global Research Center, NY 12309-1027, United States - Conference title
- Optical metrology and inspection for industrial applications (18-20 October 2010, Beijing, China)
- Conference name
- Optical metrology and inspection for industrial applications (Beijing 2010)
- Author (monograph)
- Harding, Kevin (Editor); Huang, Peisen S (Editor); Yoshizawa, Toru (Editor)
SPIE, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855 ; 78550Y.1-78550Y.8 ; ref : 8 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-8385-0
- Scientific domain
- Electronics; Metrology and instrumentation; Optics; Physics
- Publisher
- SPIE, Bellingham, Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Algorithme Corrosion Déphasage Erreur mesure Etalonnage Méthode mesure Méthode optique Traitement image 0130C 0760 4230V Métrologie optique
- Keyword (en)
- Algorithms Corrosion Phase shift Measurement errors Calibration Measuring methods Optical method Image processing Optical metrology
- Keyword (es)
- Método óptico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30V Image forming and processing
- Discipline
- Metrology Physics : optics Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 23848456
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1117/12.872022 
https://dx.doi.org/10.1117/12.872022
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