Influences of Switching Field Rise Time on Microwave-Assisted Magnetization Reversal
- Author
- HAI LI1 ; FEI HOU1 ; PENG LI2 ; XIAOFEI YANG1
[1] Department of Electronic Science and Technology, Huazhong University of Science and Technology, Wuhan, Hubei 430074, China
[2] Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, United States - Conference title
- Selected papers from the 2nd International Conference on Microwave Magnetics, Boston, Massachusetts, June 1-4, 2010
- Conference name
- ICMM 2010 International Conference on Microwave Magnetics (2 ; Boston, Massachusetts 2010-06-01)
- Author (monograph)
- IEEE Magnetics Society, United States (Organiser of meeting)
- Source
IEEE transactions on magnetics. 2011, Vol 47, Num 2, pp 355-358, 4 p ; 1 ; ref : 16 ref
- CODEN
- IEMGAQ
- ISSN
- 0018-9464
- Scientific domain
- Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Exchange spring media microwave rise time switching field
- Keyword (fr)
- Aimantation Commutation Hyperfréquence Propriété magnétique Ressort
- Keyword (en)
- Magnetization Switching Microwave radiation Magnetic properties Springs
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A90 Other topics in materials science
- Discipline
- Physics and materials science
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 23853836
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TMAG.2010.2089609 
https://dx.doi.org/10.1109/TMAG.2010.2089609
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