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The THz Time Domain Spectra of SrB407 Crystal

Author
YALI WANG1 ; BIHUI HOU2 ; HAIYAN WANG3 ; GUOZHONG ZHAO3 ; YISHI SHI1
[1] College of Materials Science and Optoelectronic Technology, Graduate University of Chinese Academy of Sciences, Beijing 100049, China
[2] College of Applied Sciences, Beijing University of Technology, Beijing 100124, China
[3] Department of Physics, Capital Normal University, Beijing 100048, China
Conference title
Infrared, millimeter wave, and terahertz technologies (18-20 October 2010, Beijing, China)
Conference name
Infrared, millimeter wave and terahertz technologies (Beijing 2010)
Author (monograph)
Cunlin Zhang (Editor); Xi-Cheng Zhang (Editor); Sigel, Peter H (Editor); Li He (Editor); Sheng-Cai Shi (Editor)
SPIE, United States (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7854 ; 785417.1-785417.6 ; ref : 7 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-8384-3
Scientific domain
Electronics; Metrology and instrumentation; Optics; Physics
Publisher
SPIE, Bellingham, Wash
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Coefficient absorption Cristal orthorhombique Faisceau polarisé Indice réfraction Matériau non linéaire Matériau optique Polissage Propriété optique 0130C 0757
Keyword (en)
Absorption coefficients Orthorhombic crystals Polarized beams Refractive index Non linear material Optical materials Polishing Optical properties
Keyword (es)
Cristal ortorrómbico Material no lineal
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings

Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G57 Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques

Discipline
Metrology Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
23880134

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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