Trapping and escape of dislocations in micro-crystals with external and internal barriers
- Author
- EL-AWADY, Jaafar A1 2 ; RAO, Satish I1 3 ; WOODWARD, Christopher1 ; DIMIDUK, Dennis M1 ; UCHIC, Michael D1
[1] Air Force Research Laboratory. Materials and Manufacturing Directorate, AFRL/RXLM Wright-Patterson AFB, OH 45433-7817, United States
[2] Universal Technology Corporation, 1270 North Fairfield Road, Dayton, OH 45432-2600, United States
[3] UES, 4401 Dayton-Xenia Rd., Dayton, OH 45432-1894, United States - Source
International journal of plasticity. 2011, Vol 27, Num 3, pp 372-387, 16 p ; ref : 1 p
- CODEN
- IJPLER
- ISSN
- 0749-6419
- Scientific domain
- Mechanics acoustics; Metallurgy, welding
- Publisher
- Elsevier, Kidlington
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- Coatings Dislocation dynamics Size effects
- Keyword (fr)
- Activation Densité dislocation Dislocation Effet dimensionnel Etude expérimentale Glissement dislocation Glissement dévié Modèle dynamique Modélisation Mouvement dislocation Méthode maillon le plus faible Piégeage Revêtement Solution faible Surface glissement Surface libre
- Keyword (en)
- Activation Dislocation density Dislocations Size effect Experimental study Dislocation glide Cross slip Dynamic model Modelling Dislocation motion Weakest link method Trapping Coatings Weak solution Slip surface Free surface
- Keyword (es)
- Activación Deslizamiento díslocación Deslizamiento desvíado Modelo dinámico Metodo eslabon el mas debil Solución débil Superficie deslizamiento Superficie libre
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40F Solid mechanics / 001B40F30 Structural and continuum mechanics / 001B40F30J Inelasticity (thermoplasticity, viscoplasticity...)
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72F Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)
- Discipline
- Physics : solid mechanics Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 23901181
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.ijplas.2010.06.006 
https://dx.doi.org/10.1016/j.ijplas.2010.06.006
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