The changes of short range ordering in amorphous silicon-carbon alloys by thermal annealing
- Author
- GRACIN, D1 ; RADIC, N1 ; IVANDA, M1 ; ANDREIC, Z1 ; PRACEK, B2
[1] Ruder Bošković Institute, POB 1016, Zagreb 10001, Croatia
[2] Institute for Electronics and Vacuum Technique, POB 59, Ljubljana 61000, Slovenia - Conference title
- ICTF-10 International Conference on Thin Films
- Conference name
- ICTF-10 International Conference on Thin Films (10 ; Salamanca 1996-09-23)
- Author (monograph)
- COLLIGON, John S (Editor)1 ; DE SEGOVIA, José L (Editor)2 ; MARTINEZ-DUART, José M (Editor)3
Spanish Vacuum Society (ASEVA), Spain (Funder/Sponsor)
International Union for Vacuum Science, Technique and Applications ; Vacuum Science Division, International (Funder/Sponsor)
International Union for Vacuum Science, Technique and Applications ; Thin Film Division, International (Funder/Sponsor)
[1] University of Salford, Salford, United Kingdom
[2] Instituto de Física Aplicada, CSIC, Madrid, Spain
[3] Universidad AutÓnoma, Madrid, Spain - Source
Thin solid films. 1998, Vol 317, Num 1-2, pp 206-209 ; ref : 18 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier Science, Lausanne
- Publication country
- Switzerland
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Couche mince Cristallisation Etude expérimentale Liaison chimique Matériau amorphe hydrogéné Modèle structure Ordre courte distance Ordre désordre Recuit thermique Silicium carbure Spectre IR Structure état amorphe C Si a-Si0,7C0,3:H a-Si0,9C0,1:H Composé minéral
- Keyword (en)
- Thin films Crystallization Experimental study Chemical bonds Amorphous hydrogenated material Structural models Short-range order Order disorder Thermal annealing Silicon carbides Infrared spectra Amorphous state structure Inorganic compounds
- Keyword (es)
- Orden desorden Recocido térmico Estructura estado amorfo
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2393140
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0040-6090(97)00516-6 
https://dx.doi.org/10.1016/S0040-6090(97)00516-6
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