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Thermal stability of GaN on (111) Si substrate

Author
ISHIKAWA, H1 ; YAMAMOTO, K1 ; EGAWA, T2 ; SOGA, T3 ; JIMBO, T2 3 ; UMENO, M1
[1] Department of Electrical and Computer Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466, Japan
[2] Research Center for Micro-Structure Devices, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466, Japan
[3] Department of Environmental Technology and Urban Planning, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466, Japan
Conference title
Nitride semiconductors 1997
Conference name
ICNS'97 International Conference on Nitride Semiconductors (2 ; Tokushima 1997-10-27)
Author (monograph)
HIRAMATSU, K (Editor)1 ; KISHINO, K (Editor)2 ; NAKAMURA, S (Editor)3 ; AMANO, H (Editor)4
The Japan Society of Applied Physics, Japan (Funder/Sponsor)
[1] Mie University, Japan
[2] Sophia University, Japan
[3] Nichia Chemical Industries, Japan
[4] Meijo University, Japan
Source

Journal of crystal growth. 1998, Vol 189-90, pp 178-182 ; ref : 4 ref

CODEN
JCRGAE
ISSN
0022-0248
Scientific domain
Crystallography; Geology; Metallurgy, welding
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Keyword (fr)
Basse température Composé binaire Couche mince Couche tampon Etude expérimentale Gallium nitrure Gonflement Interface solide solide Méthode MOCVD Recuit thermique Semiconducteur III-V Stabilité thermique Substrat Ga N GaN Composé minéral
Keyword (en)
Low temperature Binary compounds Thin films Buffer layer Experimental study Gallium nitrides Swelling Solid-solid interfaces MOCVD Thermal annealing III-V semiconductors Thermal stability Substrates Inorganic compounds
Keyword (es)
Baja temperatura Capa tampón Recocido térmico
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H60 Physical properties of thin films, nonelectronic / 001B60H60D Thermal stability; thermal effects

Pacs
6860D Thermal stability; thermal effects

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
2396015

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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