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Nanosecond multi-pulse damage investigation of optical coatings in atmosphere and vacuum environments

Author
XIULAN LING1 2
[1] Department of Opto-Electronic Engineering, North University of China, Taiyuan 030051, China
[2] Key Laboratory of Material Science and Technology for High Power Lasers, Shanghai Institute of Optics and Fine Mechanics, Shanghai 201800, China
Source

Applied surface science. 2011, Vol 257, Num 13, pp 5601-5604, 4 p ; ref : 25 ref

ISSN
0169-4332
Scientific domain
General chemistry, physical chemistry; Crystallography; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
42.79.Wc 68.37.Hk 81.70.Fy Air-vacuum effect Defect statistical model Fatigue effect Laser-induced damage Vacuum
Keyword (fr)
Effet physique rayonnement Endommagement Fatigue Modèle statistique Rayonnement laser Revêtement optique
Keyword (en)
Physical radiation effects Damage Fatigue Statistical models Laser radiation Optical coatings
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology

Discipline
Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
23961903

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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