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Influence of annealing on optical and electrical properties of ZnGeP2 single crystals

Author
QIANG FAN1 ; SHIFU ZHU1 ; BEIJUN ZHAO1 ; BAOJUN CHEN1 ; ZHIYU HE1 ; JIANG CHENG1 ; TING XU1
[1] Department of Materials Science, Sichuan University, Chengdu 610064, China
Conference title
The 16th International Conference on Crystal Growth (ICCG16)/The 14th International Conference on Vapor Growth and Epitaxy (ICVGE14), 8-13 August 2010, Beijing, China
Conference name
ICCG16 International Conference on Crystal Growth (16 ; Beijing 2010-08-08) = ICVGE14 International Conference on Vapor Growth and Epitaxy (14 ; Beijing 2010-08-08)
Author (monograph)
CHEN, Chuangtian (Editor)1 ; KUECH, Thomas F (Editor)2 ; NISHINAGA, Tatau (Editor)3 ; ZHENG, Lili (Editor)4
International Organization for Crystal Growth (IOCG), International (Organiser of meeting)
[1] Chinese Academy of Sciences, China
[2] University of Wisconsin-Madison, United States
[3] The University of Tokyo, Japan
[4] Tsinghua University, China
Source

Journal of crystal growth. 2011, Vol 318, Num 1, pp 725-728, 4 p ; ref : 18 ref

CODEN
JCRGAE
ISSN
0022-0248
Scientific domain
Crystallography; Geology; Metallurgy, welding
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Author keyword
A1. Annealing A1. Properties characterization A1. Varying environmental conditions B1. Single crystal B2. ZnGeP2
Keyword (fr)
Absorption optique Annihilation positon Clivage Conductivité type p Conductivité électrique Croissance cristalline en phase fondue Densité porteur charge Diagramme rotation Diffraction RX Durée vie Défaut ponctuel Effet Hall Facteur transmission Germanium Zinc Phosphure Mixte Lacune Monocristal Méthode Bridgman Polycristal Propriété optique Propriété symétrie Propriété électrique Recuit Spectre IR Spectre absorption Structure cristalline Zinc 7350 7361 7866 8110F Zn ZnGeP2
Keyword (en)
Optical absorption Positron annihilation Cleavage P type conductivity Electrical conductivity Crystal growth from melts Carrier density Rocking curve XRD Lifetime Point defects Hall effect Transmittance Germanium Zinc Phosphides Mixed Vacancies Monocrystals Bridgman method Polycrystals Optical properties Symmetry property Electrical properties Annealing Infrared spectra Absorption spectra Crystal structure Zinc
Keyword (es)
Absorción óptica Conductividad tipo p Diagrama rotación Factor transmisión Mixto Propiedad simetría
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C50 Electronic transport phenomena in thin films and low-dimensional structures

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C61 Electrical properties of specific thin films

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A10 Methods of crystal growth; physics of crystal growth / 001B80A10F Growth from melts; zone melting and refining

Discipline
Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
24025551

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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